Microelectronics Reliability
 2013
DOI: 10.1016/j.microrel.2012.08.004
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Experimental evaluation of hot electron reliability on differential Clapp-VCO

Sheng‐Lyang Jang
1
,
J.S. Yuan
2
,
Shih-Chieh Yen
3
et al.
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Cited by 3 publications
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Experimental evaluation of hot-carrier stressed series-tuned injection-locked frequency divider

Jang
1
,
Huang
2
,
Fu
3
et al. 2014
Analog Integr Circ Sig Process
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Experimental evaluation of hot-carrier stressed series-tuned injection-locked frequency divider

Jang
1
,
Huang
2
,
Fu
3
et al. 2014
Analog Integr Circ Sig Process
2
0
0
0
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Comparative Study Between Hartley and Colpitts VCO for 5G MM-Wave Band Applications

Es-Saqy
1
,
Abata
2
,
Mazer
3
et al. 2019
2019 7th Mediterranean Congress of Telecommunications (CMT)
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Current Reuse Oscillator Design for 5G Mobile Application using 90nm CMOS

Karthigeyan1,
Radha2
2020
2020 International Conference on Communication and Signal Processing (ICCSP)
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