Experimental comparison of high-performance water vapor permeation measurement methods

Nisato, Giovanni; Klumbies, Hannes; Fahlteich, John; Müller‐Meskamp, Lars; Weijer, Peter van de; Bouten, P.C.P.; Boeffel, Christine; Leunberger, David; Graehlert, W.; Edge, Steven; Cros, Stéphane; Brewer, Paul J.; Kücükpinar, Esra; Girolamo, J. de; Srinivasan, P.

doi:10.1016/j.orgel.2014.10.014

Cited by 43 publications

(33 citation statements)

References 19 publications

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“…This effect is shown by the schematic in Figure 12 . [ 91 ] While the multilayer encapsulation introduces a long lag time, but at longer time scales the WVTR is the same in both structures. This effect was also demonstrated by Hermenau et al [ 86 ] while testing different encapsulation materials on small molecule solar cells.…”

Section: Barriers and Sealing: Lag Time Versus Equilibriummentioning

confidence: 99%

“…Initial WVTR values are lower due to the long diffusion rates of water vapor between different encapsulation layers, however once water vapor has permeated the encapsulation the WVTR suddenly rises. [ 91 ] Over a longer time scale, multilayer encapsulation strategies result in the same water permeation as single layers. This effect is shown by the schematic in Figure 12 .…”

Section: Barriers and Sealing: Lag Time Versus Equilibriummentioning

confidence: 99%

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Procedures and Practices for Evaluating Thin‐Film Solar Cell Stability

Roesch

Faber

Hauff

et al. 2015

Advanced Energy Materials

149

133

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functionality such as solution processing, have been the motivation driving these technologies. Additionally, compared to more conventional photovoltaics such as silicon solar cells, the device operation principles of many of these thin fi lm photovoltaic technologies are dependent on complex physical mechanisms, such as excitonic processes, photoinduced charge separation, functional material interfaces.Whereas initial research efforts were focused on understanding the underlying device physics and improvements in power conversion effi ciency, with increasing maturity of these photovoltaic technologies, growing efforts are now being invested into the understanding of underlying degradation mechanisms and the improvement of device stability. In addition to effi ciency, increased device lifetimes are fundamental requirements for transforming these technologies into an economic viability. In early studies, many stability investigations with various stress conditions were conducted in order to gain a better understanding of the degradation mechanisms. Currently, however, a consolidation towards some common stress scenarios for stability has been pursued in order to enable a better comparability between results of different research labs worldwide. A particularly well organized large scale effort was conducted within the framework of the International Summit on Organic Solar Cell Stability (ISOS), leading to the so-called ISOS-protocols. Nowadays, During the last few decades, and in some cases only the last few years, novel thin-fi lm photovoltaic (PV) technologies such as dye-sensitized solar cells (DSSC), organic solar cells (OPV), and, more recently, perovskite-based solar cells (PSC) have been growing in maturity with respect to device performance and device stability. Together with new material systems, novel device architectures have also been introduced. Both parameters will have an effect on the overall device stability. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS-protocols, statements concerning application lifetimes can fi nally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability.

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Section: Barriers and Sealing: Lag Time Versus Equilibriummentioning

confidence: 99%

Section: Barriers and Sealing: Lag Time Versus Equilibriummentioning

confidence: 99%

Procedures and Practices for Evaluating Thin‐Film Solar Cell Stability

Roesch

Faber

Hauff

et al. 2015

Advanced Energy Materials

149

133

View full text Add to dashboard Cite

show abstract

“…For determining low‐value intrinsic barrier properties of the SiN layers, the optical Ca‐test developed at Philips Research has been shown to be an accurate test configuration . By looking at the gradual uniform increase in transmission of semitransparent metallic Ca films upon exposure to air, WVTR values as low as 10 −6 g/m 2 /day can be determined.…”

Section: Bottom Barrier Performancementioning

confidence: 99%

High‐temperature thin‐film barriers for foldable AMOLED displays

et al. 2018

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We present a thin‐film dual‐layer bottom barrier on polyimide that is compatible with 350°C backplane processing for organic light‐emitting diode displays and that can facilitate foldable active‐matrix organic light‐emitting diode devices with a bending radius of <2 mm. We demonstrate organic light‐emitting diodes that survive bending over 0.5 mm radius for 10.000× based on the high‐temperature bottom barrier. Furthermore, we show compatibility of the bottom barrier with the backplane process by fabricating active‐matrix organic light‐emitting diode displays on GEN1‐sized substrates.

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“…It has been reported that they should have WVTRs of 10 -5 -10 -6 g·m -2 ·day -1 [1]; however, this requirement has not been proven yet. Various WVTR evaluation techniques exist, but the values obtained by different measurement systems for the same batch of barrier films sometimes differ [2][3][4]. WVTR measurements are primarily affected by differences between individual barrier films, such as between the uniformities or endurances of their barrier layers.…”

Section: Introductionmentioning

confidence: 99%