2019
DOI: 10.1016/j.solmat.2019.110194
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Error analysis of aged modules with cracked polyamide backsheets

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Cited by 66 publications
(65 citation statements)
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“…However, as described in detail in the IEA PVPS Task 13 report on "Assessment of Photovoltaic Module Failures in the Field" [21], many PV module failure modes are related to unfavorable material interactions or material degradations. Thus, recently, several researches active in failure analysis of PV modules, e.g., [7,[22][23][24][25][26][27], started transferring the technically mature portable spectrometers (IR, Raman, NIR) to this different field of application and applied them for nondestructively • validating the bill of materials (BOM) of PV devices, and • documenting the aging effects of polymeric materials (i.e., encapsulation, backsheet).…”
Section: Mobile Devices For Onsite Usementioning
confidence: 99%
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“…However, as described in detail in the IEA PVPS Task 13 report on "Assessment of Photovoltaic Module Failures in the Field" [21], many PV module failure modes are related to unfavorable material interactions or material degradations. Thus, recently, several researches active in failure analysis of PV modules, e.g., [7,[22][23][24][25][26][27], started transferring the technically mature portable spectrometers (IR, Raman, NIR) to this different field of application and applied them for nondestructively • validating the bill of materials (BOM) of PV devices, and • documenting the aging effects of polymeric materials (i.e., encapsulation, backsheet).…”
Section: Mobile Devices For Onsite Usementioning
confidence: 99%
“…One well-known example is the formation of different types of cracks in Polyamide (PA)-based backsheets observed in several PV plants within the last years. One type of cracking (micro-cracks) [24] showed beginning material degradation (oxidative degradation) on the environmental side of the PA-backsheet and has not been correlated with a loss in electrical performance so far. Another type of cracking (squared cracks) [24], however, exhibited first material degradation effects at the interface between EVA encapsulant and PA backsheet in the intercellular spaces.…”
Section: Measurements On Field-aged Pv Modulesmentioning
confidence: 99%
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