2019
DOI: 10.1063/1.5117881
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Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy

Abstract: Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and theory, we develop a model that relates the detected X-PEEM contrast to the emergence of uncompensated bound charges, explaining the image formation based on intrinsic electronic domain-wall properties. In contrast to previously applied low-temperature electrostatic force microscopy (EFM), X-… Show more

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Cited by 6 publications
(4 citation statements)
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“…The ultrahigh nanometer spatial resolution enables versatile research on the micro‐photophysics, for instance, SPP, plasmonic skyrmion, ferroelectric domain, ​and carrier transportation. [ 17,18,39–43 ] Further application can extend to the nanoscale observation of Moiré superlattice in twisted vdW material like s‐SNOM. [ 16 ] In this report, we extend the PEEM technique to disclose the light–matter interaction in a semiconductor microcavity under resonant photoexcitation.…”
Section: Discussionmentioning
confidence: 99%
“…The ultrahigh nanometer spatial resolution enables versatile research on the micro‐photophysics, for instance, SPP, plasmonic skyrmion, ferroelectric domain, ​and carrier transportation. [ 17,18,39–43 ] Further application can extend to the nanoscale observation of Moiré superlattice in twisted vdW material like s‐SNOM. [ 16 ] In this report, we extend the PEEM technique to disclose the light–matter interaction in a semiconductor microcavity under resonant photoexcitation.…”
Section: Discussionmentioning
confidence: 99%
“…Improper ferroelectric domain walls in the hexagonal manganites have been extensively studied both experimentally [16,17,[19][20][21][22][23][24][63][64][65][66][67] and by DFT simulations [12,[20][21][22]37,[41][42][43][44], whereas for the hexagonal gallates (h-RGaO 3 ) only the charged domain walls have been assessed using DFT [41]. Concerning neutral domain walls, our calculations reveal that their atomic structures are directly comparable to YMnO 3 [12], as the wall formation is governed by the ionic nature of the Y-O bonds, and not the Mn-O or Ga-O bonds [38,40].…”
Section: Discussionmentioning
confidence: 99%
“…101 Differing from proper ferroelectrics, these charged walls are explicitly stable and persist even when their bound charges are not fully screened, representing a rare example of a stable, electronically uncompensated oxide interface. 166,167 While it is still possible to manipulate domain wall positions via, e.g., applied strain, 158 electric fields, 49,155,156,168 and annealing, [169][170][171] the biggest advantage lies in their stability, which allows using them as robust template for local property engineering. 172,173 Early studies have adopted strategies from semiconductor research changing, e.g., domain wall currents and the electronic domain wall width via aliovalent doping, demonstrating the general possibility to optimize and tailor the response at improper ferroelectric domain walls.…”
Section: Improper Ferroelectrics For Domain Wall Electronicsmentioning
confidence: 99%