2017
DOI: 10.1002/adfm.201706113
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Electron Field Emission of Geometrically Modulated Monolayer Semiconductors

Abstract: Electron field emission, electrons emitted from solid surfaces under high electric field, offers significant scientific interests in materials sciences and potential optoelectronics applications. 2D atomic layers, such as MoS2, exhibit fascinating properties for diverse applications in next‐generation nanodevices and rich physical phenomena for fundamental research. However, the study on field emission of semiconducting monolayers is lacking owing to its low efficiency and stability of electron emission. Here,… Show more

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Cited by 39 publications

(33 citation statements)
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“…From the high‐magnification scanning electron microscopy (SEM) images in the inset of Figure d, we see that some of the NWs have a tent‐like structure. This has been reported in other 2D–1D structures, but the others were bent or even fallen after the WSe 2 transfer. Since this tent‐like structure is believed to be responsible for the field emission, we focus on it in this work.…”
Section: Results
supporting
confidence: 82%
How this paper cites the one you are viewing
“…From the high‐magnification scanning electron microscopy (SEM) images in the inset of Figure d, we see that some of the NWs have a tent‐like structure. This has been reported in other 2D–1D structures, but the others were bent or even fallen after the WSe 2 transfer. Since this tent‐like structure is believed to be responsible for the field emission, we focus on it in this work.…”
Section: Results
supporting
confidence: 82%
How this paper cites the one you are viewing
“…HAADF imaging has been demonstrated to be an effective way for atom-by-atom chemical analysis in monolayer materials while the atomic intensity is directly used to distinguish different atomic species such as MoSe 2x S 2(1−x) 9 and W x Mo 1−x Se 2y S 2(1−y) . 10 In this study, the large Z 2 value difference between the heavy atom W (Z 2 = 5476) and the lighter atom Nb (Z 2 = 1681) makes them easy to be identified. Because of the heavy atomic weight of the W atom, it exhibits a brighter HAADF contrast than the Nb atom.…”
Section: Results
mentioning
confidence: 89%
“…Figure a shows a low-magnification bright field STEM (BF-STEM) image exhibiting a large area of monolayer ternary alloy. HAADF imaging has been demonstrated to be an effective way for atom-by-atom chemical analysis in monolayer materials while the atomic intensity is directly used to distinguish different atomic species such as MoSe 2 x S 2(1– x ) and W x Mo 1– x Se 2 y S 2(1– y ) . In this study, the large Z 2 value difference between the heavy atom W ( Z 2 = 5476) and the lighter atom Nb ( Z 2 = 1681) makes them easy to be identified.…”
Section: Results and Discussion
mentioning
confidence: 97%
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“…The sharpness of the bending, referred to as the K of the I–F curve, should be proportional to the bandgap. The behavior has been observed in static-field emission from semiconductors 35 , which is expected to be observed in OFE in principle.
Fig. 1Operation principle of extreme nonlinear OFE.
…”
Section: Introduction
mentioning
confidence: 78%