Electrical, microstructural, physical and chemical characterization of hv xlpe cable peelings for an electrical aging diagnostic data base

Fothergill, J.C.; Montanari, Gian Carlo; Stevens, G.C.; Laurent, Christian; Teyssèdre, G.; Dissado, L.A.; Nilsson, U.H.; Platbrood, G.

doi:10.1109/tdei.2003.1207480

Cited by 109 publications

(86 citation statements)

References 20 publications

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“…With the growth of nanohole, PD occurs in it. Electrical tree grows continuously in the surrounding polymer region until it spreads through the insulation between the electrodes and then breakdown takes place [22][23].…”

Section: The Spatio-temporal Relation Between Ageing Degradation Andmentioning

confidence: 99%

Short-term breakdown and long-term failure in nanodielectrics: a review

Yin

Chen

et al. 2010

IEEE Trans. Dielect. Electr. Insul.

286

166

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Nanodielectrics, which are concentrated in polymer matrix incorporating nanofillers, have received considerable attention due to their potential benefits as dielectrics. In this paper, short-term breakdown and long-term failure properties of nanodielectrics have been reviewed. The characteristics of polymer matrix, types of nanoparticle and its content, and waveforms of the applied voltage are fully evaluated. In order to effectively comment on the published experimental data, a ratio k has been proposed to compare the electric properties of the nanodielectrics with the matrix and assess the effect for nanoparticles doping. There is evidence that the short-term breakdown properties of nanodielectrics show a strong dependence on the applied voltage waveforms. The polarity and the cohesive energy density (CED) of polymer matrix have a dramatic influence on the properties of nanodielectrics. Nanoparticle doped composites show a positive effect on the long-term failure properties, such as ageing resistance and partial discharge (PD) properties of nanocomposites are superior than microcomposites and the matrix. The larger the dielectric constant and CED of the matrix become, the more significant improvements in long-term performance appear. Based on the reported experimental results, we also present our understandings and propose some suggestions for further work.

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Section: The Spatio-temporal Relation Between Ageing Degradation Andmentioning

confidence: 99%

Short-term breakdown and long-term failure in nanodielectrics: a review

Yin

Chen

et al. 2010

IEEE Trans. Dielect. Electr. Insul.

286

166

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“…The base polymer was peroxide cross-linked following extrusion. Cable sections and insulation peelings were then used to characterize the insulation [8]. The cables were then electro-thermally stressed for given periods of time, after which sections were cut from them some being investigated as a cable section and some peeled to give insulation peelings for evaluation.…”

Section: Methodsmentioning

confidence: 99%

“…This is compared to the value obtained for the dc-conductivity determined by dielectric spectroscopy of both the peelings and a section cut from the same cable from which the peelings were taken. The aim is to build up a body of data on carrier transport and charge packets on a well defined material [8] that can be used to critically assess the various physical mechanisms proposed to explain the packet phenomenon.…”

Section: Introductionmentioning

confidence: 99%

Temperature dependence of charge packet velocity in XLPE cable peelings

Dissado

Zadeh

Fothergill

et al. 2007

2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena

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Abstract-The generation and transit of charge packets in 150m thick peelings from the insulation of Medium Voltage Cables manufactured using the same XLPE batch have been investigated at a number of different temperatures. Charge packet motion was investigated in peelings taken from cables that have been electro-thermally stressed at T= 90C for 5000 hours with a Laplacian field E  20kV/mm at the location of the samples. It was found that charge packets were generated by an applied field of 120kV/mm when the internal space charge field reached 140-150kV/mm. Measurements were made in three controlled temperature environments and it was found that the transit time fitted an Arrhenius behaviour with an activation energy of 1.2 eV. This value is similar to estimates made for the deepest traps (>1.1eV) made from the decay of space charge accumulated at lower fields of 46.67kVmm. It is also close to the activation energy for the conductivity (1.25 eV) obtained from the dielectric spectroscopy of unpeeled cable sections at E rms  0.41 V/mm, and 1.15eV from the dielectric spectroscopy of the peelings (E = 40V/mm). It is therefore concluded that the transit of the charge packet is associated with the trap-to-trap transport of charge carriers located in the deepest traps available. The implications of these results for the mechanism of charge packet generation is discussed.

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“…Aging which is difficult to be directly observed, needs to use all kinds of assessment techniques to research [1][2][3][4][5]. ARTEMIS team found that the total porosity decreased slightly, while the total pore surface area increased, considered that the pores grew and were connected to each other after aging [1].…”

Section: Introductionmentioning

confidence: 99%

“…ARTEMIS team found that the total porosity decreased slightly, while the total pore surface area increased, considered that the pores grew and were connected to each other after aging [1]. Mazzanti G [2] considered that the degradation of cable insulation starting from the micro pores in the materials.…”

Section: Introductionmentioning

confidence: 99%

Investigation on Thermal Aging of HVDC XLPE

Li¹,

Shi²,

Xiao³

2015

Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering

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Abstract. HVDC XLPE cables were widely used in the transmission line for the excellent characteristics. The thermal aging properties of HVDC XLPE insulation were investigated in this work, based on different assessment techniques, such as IR Prestige-21 Infrared Spectrometer, Thermo-Gravimetric Analyzer, and X-Ray Diffractometer. It was found that, the molecular structure of XLPE cable insulation changed during the thermal aging process, carbonyl deposed as the increase of aging time and the increase of aging temperature. There was one fastest decomposition temperature for un-aged specimen and specimen aged at low temperature, while there were multiple decomposition temperatures for specimens aged at high temperature. Numerous new chemical bonds, whose activation energies differ from that of XLPE, arise during the high temperature aging. The XLPE crystallinity increased during low-temperature aging while decreased during high-temperature aging. Low-temperature is conducive to the transition of amorphous region into crystallization region, while high-temperature has damaging effect on the crystallization region.

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Electrical, microstructural, physical and chemical characterization of hv xlpe cable peelings for an electrical aging diagnostic data base

Cited by 109 publications

References 20 publications

Short-term breakdown and long-term failure in nanodielectrics: a review

Short-term breakdown and long-term failure in nanodielectrics: a review

Temperature dependence of charge packet velocity in XLPE cable peelings

Investigation on Thermal Aging of HVDC XLPE

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