2019
DOI: 10.1021/acs.nanolett.9b02774
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Electrical Charge State Manipulation of Single Silicon Vacancies in a Silicon Carbide Quantum Optoelectronic Device

Abstract: power which are fit parameters. At 0 V, =5.2±0.3 kcts and = 10±1 mW, and at -5V, = 2.0±0.3 kcts and = 0.90±0.01 mW.

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Cited by 81 publications
(76 citation statements)
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“…22 Recently, electric field-dependent manipulation of single silicon vacancies was demonstrated using the intrinsic region of 4H-SiC p-i-n diodes. 51 In the intrinsic region, the Fermi level is close to the middle of the band gap, and switching may occur between the neutral and single negative charge state. In n-type material, on the other hand, the Fermi level is close to the conduction band with V Si predominantly in the 2À or 3À charge states.…”
Section: Discussionmentioning
confidence: 99%
“…22 Recently, electric field-dependent manipulation of single silicon vacancies was demonstrated using the intrinsic region of 4H-SiC p-i-n diodes. 51 In the intrinsic region, the Fermi level is close to the middle of the band gap, and switching may occur between the neutral and single negative charge state. In n-type material, on the other hand, the Fermi level is close to the conduction band with V Si predominantly in the 2À or 3À charge states.…”
Section: Discussionmentioning
confidence: 99%
“…Particularly, silicon vacancies (V Si ) and siliconcarbon divacancies (VV) in SiC reveal extremely long spin coherence time [7,8,16,[20][21][22][23][24][25] and hold promise to implement quantum repeaters due to inherent spin-photon interface and high spectral stability [26][27][28][29][30]. Existing device fabrication protocols on the wafer scale in combination with threedimensional (3D) defect engineering [31][32][33] allow manufacturing integrated quantum devices [34][35][36][37] with electrical [38][39][40] and mechanical [39,41,42] control of defect spin qubits. SiC nanocrystals with color centers are also suggested as fluorescence biomarkers in biomedical applications [43,44].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, the 2− and 3− charge states were shown to be more stable than V − Si in n-type material, by correlating density functional theory (DFT) calculations to deep level transient spectroscopy (DLTS) measurements [9]. Indeed, substantial enhancement of emission from V Si ensembles [9] and control of the charge state of isolated V Si defects [15] was recently demonstrated via application of electric fields, and attributed to selective population of the bright and dark charge states.…”
Section: Introductionmentioning
confidence: 99%