Effects of sputtering power and pressure on properties of ZnO:Ga thin films prepared by oblique-angle deposition

Flickyngerová, S.; Netrvalová, Marie; Šutta, P.; Νovotný, I.; Tvarožek, V.; Gaspierik, P.; Bruncko, Jaroslav

doi:10.1016/j.tsf.2011.06.073

Cited by 15 publications

(12 citation statements)

References 13 publications

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“…Obtained results are in good agreement with technological predictions and measurements carried out on other Hall measurement tools [8]. The developed system proved the potential of reliable resistivity, mobility and doping concentration measurements on various semiconductors.…”

Section: Resultssupporting

confidence: 81%

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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Kinder¹,

Mikolášek²,

Donoval³

et al. 2013

Journal of Electrical Engineering

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One of the biggest challenges of communication networks is the video transmission in real time. It requires high demands on the available network capacity and transport mechanisms. Availability of smart mobile devices with batteries, which keep the terminal working for several hours, caused an increased interest in the research of the deployment of video transmission in wireless transmission systems. The presented paper deals with the transmission of video encoded with H.264/AVC (Advanced Video Coding) video coding standard through wireless local area network (WLAN) using the programming environment OPNET Modeller (OM). The test network studied in this work was prepared by combining real and simulated networks, which allows interesting possibilities when working with the OM tools. Such an approach to working with OM allows a detailed video streaming analysis, because the video output was noticeably not only in the form of statistics, but we can see the real impact of transmission failures. Using the OM simulation environment allows to design the transmission systems, which would be difficult to establish in laboratory conditions.

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Section: Resultssupporting

confidence: 81%

“…1. [8] is usually achieved in case of state of the art ZnO layers for TCO applications in solar cells.…”

Section: Resultsmentioning

confidence: 99%

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Kinder¹,

Mikolášek²,

Donoval³

et al. 2013

Journal of Electrical Engineering

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“…In most of these preparations, MS has been the technique of choice for the simple reason that it is better suited for depositions over large areas. Some examples in the literature include the MS-OAD of Ga-doped ZnO [168,347,348] and the development of a co-sputtering method for the fabrication of high and low refractive index layers of TNO and AZO, respectively, for use in the preparation of a transparent and conductive distributed Bragg reflector [340,349]. In this structure, the eight-period stack of AZO/TNO layers produces a reflectivity of $90% along a spectral region centered at 550 nm, and a resistivity of less than 2 Â 10 À3 X cm.…”

Section: Alternative Tco Films Prepared Under Oad Conditionsmentioning

confidence: 99%

Perspectives on oblique angle deposition of thin films: From fundamentals to devices

Barranco

Borrás

González‐Elipe

et al. 2016

Progress in Materials Science

601

436

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a b s t r a c tThe oblique angle configuration has emerged as an invaluable tool for the deposition of nanostructured thin films. This review develops an up to date description of its principles, including the atomistic mechanisms governing film growth and nanostructuration possibilities, as well as a comprehensive description of the applications benefiting from its incorporation in actual devices. In contrast with other reviews on the subject, the electron beam assisted evaporation technique is analyzed along with other methods operating at oblique angles, including, among others, magnetron sputtering and pulsed laser or ion beam-assisted deposition techniques. To account for the existing differences between deposition in vacuum or in the presence of a plasma, mechanistic simulations are critically revised, discussing well-established paradigms such as the tangent or cosine rules, and proposing new models that explain the growth of tilted porous nanostructures. In the second part, we present an extensive description of applications wherein oblique-angle-deposited thin films are of relevance. From there, we proceed by considering the requirements of a large number of functional devices in which these films are currently being utilized (e.g., solar cells, Li batteries, electrochromic glasses, biomaterials, sensors, etc.), and subsequently describe how and why these nanostructured materials meet with these needs.

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“…Table 1 showed that SA-1 presented a higher crystallite size than SA-0, meaning that the substrate rotation resulted in an improving of the crystallinity for the deposited CdTe samples. Furthermore the improving in crystallinity by increasing the grain size and reducing the strain has proven to better the transmittance of ZnO nanostructures in previous works [30]. Layer porosity is the main factor that we [23][24][25][26][27][28] considered to explain the optical properties for of the CdTe samples grown using substrate rotation at different GLAD angles.…”

Section: Results and Discusionmentioning

confidence: 99%

CdTe films grown using a rotating sublimate vapor effusion source in glancing angle deposition mode

Daza

Castro-Rodrı́guez

Martín-Tovar

et al. 2017

Materials Science in Semiconductor Processing

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Effects of sputtering power and pressure on properties of ZnO:Ga thin films prepared by oblique-angle deposition

Cited by 15 publications

References 13 publications

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Perspectives on oblique angle deposition of thin films: From fundamentals to devices

CdTe films grown using a rotating sublimate vapor effusion source in glancing angle deposition mode

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