Abstract:During the manufacturing process of the system-in-package, it has become susceptible to defects and internal residual stresses when dies, components, electric functionality and geometric complexity have increased. The mismatch of thermal expansion coefficient (CTE) among packaging materials and devices may lead to various failure modes during manufacturing processes, such as die broken, solder crack, substrate interface delamination. In this paper, the effect of underfill on the reliability of a system-in-pack… Show more
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