Effect of Temperature on Dielectric Properties of Metallized Film Capacitor

He, Yushuang; Wang, Feipeng; Pan, Jianyu; Umran, Haider M.; Li, Ran; Huang, Zhengyong

doi:10.1109/icempe51623.2021.9509161

Cited by 3 publications

(4 citation statements)

References 9 publications

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“…By using the measured data of the film's relative dielectric constant at different temperatures, we can determine f εr_T by solving the polynomial (16). By substituting the latter into Equations ( 4) and ( 9), the calculation equations considering the temperature's influence can be obtained.…”

Section: The Influence Of Temperaturementioning

confidence: 99%

“…Using polynomial (16) and Equation (17) or Equation ( 18), it is possible to estimate or even predict the capacitance at different temperatures when having data on the dielectric constant changed with the temperatures of a film consisting of new materials. This will provide a reference for the performance prediction of film capacitors with new materials and the accelerated ageing of film capacitors at high temperatures.…”

Section: The Influence Of Temperaturementioning

confidence: 99%

“…As more and more film capacitors are applied to high temperature environments, the performance changes and countermeasures of film or film capacitors at high temperatures have become a key research topic. Researchers have studied the film or film capacitor's characteristics of the capacitance loss [12], location of hot spots [13], breakdown voltage [14], mechanical properties [15], dielectric constant [16], and thermal expansion caused by the temperature changes. In addition, to analyse the temperature rise characteristics of film capacitors under superimposed AC and DC voltages [17], researchers also tried to optimise their temperature rise performance by optimising the size design of film capacitors [18].…”

Section: Introductionmentioning

confidence: 99%

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Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

et al. 2023

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In the process of coping with energy and environmental protection issues, technologies such as energy materials, energy devices, and energy systems have made great progress. With excellent performance, film capacitors play an increasingly important role in energy‐related fields. With the increase of application scenarios and the continuous development of film material technology, it is urgent to establish a better theoretical connection from films to capacitors. First, the main components of the capacitor including the film and the positional relationships among them are given. Then, from the two perspectives of indirect calculation according to the volume and the direct calculation according to the winding process, the equation between the dielectric constant of films and the corresponding capacitance of capacitors is established. Further, the measurement data and error analysis results of the built test platform prove the accuracy and great potential of the proposed calculation methods. In addition, error sources, including film thickness uniformity, are listed. Finally, the challenges faced by the proposed calculation methods and the paths that can be referenced for future research are summarised and discussed.

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Section: The Influence Of Temperaturementioning

confidence: 99%

Section: The Influence Of Temperaturementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

et al. 2023

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“…In recent years, many researchers have studied the MFC, mostly focusing on dielectric material properties [9,10] and macroscopic properties [11]. After simplifying the element into a parallel-plate capacitor, Yao et al [1] analyzed the electric field distribution in MFC in the steady-state case.…”

Section: Introductionmentioning

confidence: 99%

Transient current distribution among elements in metallized film capacitor for converter valves

Yi,

Zhang,

et al. 2023

J. Phys. D: Appl. Phys.

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The metalized film capacitors (MFC) in converter valves are subjected to high-frequency currents under the action of power electronic switching, which will cause large differences in currents among capacitor elements inside MFC and seriously affect the stability of MFC. In this paper, experiments were conducted to measure the current waveforms among 90 elements under impulse, short-circuit discharge and sine waves at different frequencies. The equivalent circuit topology was simplified by using decoupling and controlled source equivalence, and parameters were extracted by electromagnetic calculations combined with experiments. Finally, an equivalent circuit model was established and the current distribution among elements was calculated. Influenced by the reactance of the parasitic inductor and the capacitor element, the frequency range can be divided into 3 regions based on the current distribution characteristics: in the high frequency range (>100 kHz), the current is mainly concentrated on several capacitor elements near the connection terminals. In the middle frequency range (about 10 kHz–100 kHz), the current oscillates between elements and the inductor, resulting in a wavy distribution of current amplitude, strongly influenced by frequency. In the low frequency range (<10 kHz), the current distribution varies very little among 90 elements. These results can support the study of performance evolution, fault analysis and design optimization in MFC.

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Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering

Yao,

Wei,

Zhang

et al. 2024

IEEE Trans. Power Electron.

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Effect of Temperature on Dielectric Properties of Metallized Film Capacitor

Cited by 3 publications

References 9 publications

Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

Transient current distribution among elements in metallized film capacitor for converter valves

Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering

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