2018
DOI: 10.1007/s10854-018-0464-4
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Effect of Ni addition into the Cu substrate on the interfacial IMC growth during the liquid-state reaction with Sn–58Bi solder

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Cited by 23 publications
(13 citation statements)
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“…Whether for Sn-58Bi/ Cu-1.5Ni system or Sn-58Bi/Cu-5Ni system, only a single (Cu,Ni) 6 Sn 5 was observed at the interface, and there was no Cu 3 Sn phase detected at reflow soldering stage. Similar phenomenon has been reported in the previous study, in which the Cu 3 Sn phase was completely eliminated when 5 or 10 wt% Ni was added to copper substrate regardless of the reaction time [6]. Maeshima et al have explained that the formation of Cu 3 Sn phase was based on the synergistic effect of the diffusion rates between the Cu and Sn atoms, and especially Cu atoms provided by the substrate were the main (2) Cu 6 Sn 5 + 9Cu = 5Cu 3 Sn factor during the liquid-state reaction [37].…”
Section: Resultssupporting
confidence: 90%
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“…Whether for Sn-58Bi/ Cu-1.5Ni system or Sn-58Bi/Cu-5Ni system, only a single (Cu,Ni) 6 Sn 5 was observed at the interface, and there was no Cu 3 Sn phase detected at reflow soldering stage. Similar phenomenon has been reported in the previous study, in which the Cu 3 Sn phase was completely eliminated when 5 or 10 wt% Ni was added to copper substrate regardless of the reaction time [6]. Maeshima et al have explained that the formation of Cu 3 Sn phase was based on the synergistic effect of the diffusion rates between the Cu and Sn atoms, and especially Cu atoms provided by the substrate were the main (2) Cu 6 Sn 5 + 9Cu = 5Cu 3 Sn factor during the liquid-state reaction [37].…”
Section: Resultssupporting
confidence: 90%
“…This growth mechanism has been found in some studies, and it could be attributed to the atomic diffusion. It was interesting that at the same reflow soldering stage, the IMC layer became thicker with more Ni addition ranging from 0 to 5 wt%, but significantly decreased in Sn-58Bi/ Cu-10Ni joint system, and the similar result had been found in previous study [6]. Thus, it could be concluded that when 10 wt% Ni was added to the Cu-xNi alloy, the growth rate of the IMC layer would decrease under the influence of the Ni elements.…”
Section: Resultssupporting
confidence: 87%
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“…At present, Sn-Bi, Sn-Cu, and Sn-Ag-Cu alloys have been used in the packaging industry. Among these alloys, Sn58Bi (SnBi) alloy presents great potentials in low-temperature packaging materials due to its superior solderability, low cost, and melting temperature [6][7][8][9][10][11]. However, the bismuth coarsened during solidification degrades the mechanical property [12][13][14].…”
Section: Introductionmentioning
confidence: 99%