“…To further understand the effect of SnI 4 on film structure, we used X-ray diffraction (XRD) to probe the film crystallinity. As shown in Figure 2 G, XRD patterns of pristine and doped (PEA) 2 SnI 4 films show similar diffraction peaks, which are assigned to the strong (0 0 l ) ( l = 2, 4, 6, 8, 10, 12, 14) diffractions at 5.5°, 10.9°, 16.4°, 21.9°, 27.4°, 33.0°, and 38.7°, respectively, indicating a layered structure of the films ( Reo et al., 2021 ; Zhu et al., 2020a ). However, the full width at half maximum (FWHM) of (0 0 2) peaks are found to be 0.197°, 0.183°, and 0.182° for pristine, 1 mol %, and 5 mol % SnI 4 -doped films, respectively.…”