2004
DOI: 10.1109/ted.2004.826844
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Effect of discrete impurities on electron transport in ultrashort MOSFET using 3D MC simulation

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Cited by 64 publications
(38 citation statements)
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References 24 publications
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“…Then, the error of the meanfield approximation is smaller than the technical error ͑i.e., mesh error͒ due to the finite size of the cells. The long-range Coulomb interaction is well captured with the mean-field approximation, while this approximation is really bad strategy to capture the short-range Coulomb interaction [28][29][30][31][32] ͑see Fig. 8 in the paper͒.…”
Section: ͑B4͒mentioning
confidence: 99%
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“…Then, the error of the meanfield approximation is smaller than the technical error ͑i.e., mesh error͒ due to the finite size of the cells. The long-range Coulomb interaction is well captured with the mean-field approximation, while this approximation is really bad strategy to capture the short-range Coulomb interaction [28][29][30][31][32] ͑see Fig. 8 in the paper͒.…”
Section: ͑B4͒mentioning
confidence: 99%
“…Looking at final expression ͑B7͒, rewritten here as W k ͑r ជ , t͒ = W mean ͑r ជ , t͒ − V͑r ជ , r ជ k ͓t͔͒, it seems that W k ͑r ជ , t͒ can be computed from a unique mean-field solution of the Poisson equation W mean ͑r ជ , t͒ when subtracting the appropriate two-particle potential V͑r ជ , r ជ k ͓t͔͒. In fact, this is the strategy used in several recent works [28][29][30][31][32] to improve the treatments of the short-range Coulomb interaction in electron device Monte Carlo simulators. However, this strategy is not as general as our procedure because these works need an analytical expression for the two-particle Coulomb interaction V͑r ជ , r ជ k ͓t͔͒.…”
Section: ͑B4͒mentioning
confidence: 99%
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“…The good agreement validates our approach of electron-ion interaction. It should be noted that this atomistic transport model also gives the correct mobility for minority electrons [8].…”
Section: Model and Simulated Structuresmentioning
confidence: 94%
“…3D atomistic Monte Carlo simulation is now becoming the key-technique that gives a more realistic description of transport [6][7][8][9] if it includes a good description of both the long-range and short-range parts of the electron-ion interaction.…”
Section: Model and Simulated Structuresmentioning
confidence: 99%