Superlattices and Microstructures volume 39, issue 1-4, P185-192 2006 DOI: 10.1016/j.spmi.2005.08.041 View full text
A. El Manouni, F.J. Manjón, M. Mollar, B. Marí, R. Gómez, M.C. López, J.R. Ramos-Barrado

Abstract: We report the structural, optical, and electrical characterization of aluminium-doped zinc oxide thin films grown by the spray pyrolysis method. We report the effect of Al concentration on the resistivity and on the X-ray diffraction, transmittance, photoluminescence and Raman scattering spectra of the films. The minimum resistivity is obtained for the sample with nominal Al concentration of 1%. An increase of the Al doping decreases the quality of the films. The loss of short-range order affects the photolum…

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