2013
DOI: 10.1016/j.orgel.2012.10.016
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Dry growth of n-octylphosphonic acid monolayer for low-voltage organic thin-film transistors

Abstract: Dry method for monolayer deposition of n-octylphosphonic acid (C 8 PA) on the surface of aluminium oxide (AlO x ) is presented. Vacuum thermal evaporation is employed to deposit initial thickness corresponding to several C 8 PA monolayers, followed by a thermal desorption of the physisorbed C 8 PA molecules. AlO x functionalized with such C 8 PA monolayer exhibits leakage current density of ~ 10

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Cited by 15 publications
(28 citation statements)
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“…Finally, Hill at al [2] performed similar experiment and achieved the best transistor performance for C 8 PA monolayer. In addition, they obtained similar mobilities and threshold voltages for transistors with C 6 PA and C 14 PA monolayers, even though the grain size of pentacene grown on these two monolayers was vastly different.…”
Section: Introductionmentioning
confidence: 76%
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“…Finally, Hill at al [2] performed similar experiment and achieved the best transistor performance for C 8 PA monolayer. In addition, they obtained similar mobilities and threshold voltages for transistors with C 6 PA and C 14 PA monolayers, even though the grain size of pentacene grown on these two monolayers was vastly different.…”
Section: Introductionmentioning
confidence: 76%
“…For FTIR, a blanket layer of aluminium was thermally evaporated and UV/ozone oxidation was used to form thin AlO x [11] with low surface roughness of ~0.48 nm [8]. C 8 PA was thermally evaporated on top of AlO x and subsequently heated to 160C for 25, 90 and 210 minutes.…”
Section: Methodsmentioning
confidence: 99%
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