volume 33, issue 20, P1360-1365 1993
DOI: 10.1002/pen.760332009
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Abstract: An experimental setup is presented that enables the whole optical characterization of an anisotropic medium to be achieved at the same spot. Based on total internal reflection measurements, the Double Arm Pulfrich Refractometer p r e vides high precision simultaneous refractive index data, which are gathered without moving the sample. This technique is particularly well suited to the case of biaxial materials. Illustration of its potential is given on some preliminary orientation measurements of biaxially str…

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