A spectral domain approach to solving planar aperture type problems is described. The method is first formulated for an arbitrary aperture in a conducting plane separating two half‐spaces, then applied to the case of a fin‐line structure. The formulation is carried out in the spectral domain in terms of the aperture electric field instead of the electric current density on the plane. The TE‐TM decomposition of the fields in the spectral domain is used in conjunction with the transmission‐line equivalent model to construct the Green's functions associated with the problem.