Direct characterization of intrinsic defects in monolayer ReSe<sub>2</sub> on graphene

Lam, Nguyen Huu; Ko, Jae-Hyeok; Choi, Byoung Ki; Ly, Trinh Thi; Lee, Giyeok; Jang, Kyuha; Chang, Young Jun; Soon, Aloysius; Kim, Jungdae

doi:10.1039/d3na00363a

Nanoscale Adv.

2023

DOI: 10.1039/d3na00363a

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Direct characterization of intrinsic defects in monolayer ReSe₂ on graphene

Nguyen Huu Lam,

Jae-Hyeok Ko,

Byoung Ki Choi

et al.

Abstract: Understanding the characteristics of intrinsic defects in crystals is of great interest in many fields, from fundamental physics to applied materials science. Combined investigations of scanning tunneling microscopy/spectroscopy (STM/S) and...

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Direct characterization of intrinsic defects in monolayer ReSe₂ on graphene

Abstract: Understanding the characteristics of intrinsic defects in crystals is of great interest in many fields, from fundamental physics to applied materials science. Combined investigations of scanning tunneling microscopy/spectroscopy (STM/S) and...

Cited by 2 publications

References 50 publications

Illustrating the pertinacious interlayer charge compression effect in van der Waals heterointerfaces

Illustrating the pertinacious interlayer charge compression effect in van der Waals heterointerfaces

Machine-learning-empowered identification of initial growth modes for 2D transition metal dichalcogenide thin films

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Direct characterization of intrinsic defects in monolayer ReSe2 on graphene

Abstract: Understanding the characteristics of intrinsic defects in crystals is of great interest in many fields, from fundamental physics to applied materials science. Combined investigations of scanning tunneling microscopy/spectroscopy (STM/S) and...

Cited by 2 publications

References 50 publications

Illustrating the pertinacious interlayer charge compression effect in van der Waals heterointerfaces

Illustrating the pertinacious interlayer charge compression effect in van der Waals heterointerfaces

Machine-learning-empowered identification of initial growth modes for 2D transition metal dichalcogenide thin films

Contact Info

Product

Resources

About

Direct characterization of intrinsic defects in monolayer ReSe₂ on graphene