Diagnosis of scan cells in BIST environment

Rajski, J.; Tyszer, Jerzy

doi:10.1109/12.780879

Cited by 58 publications

(58 citation statements)

References 14 publications

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“…A set of non-linear equations is subsequently solved to identify the set of failing scan cells. A partitioning-based method that uses an LFSR to gate inputs of a MISR-based compactor was proposed in [26]. For each BIST session, a different pseudorandom selection of scan cells is used.…”

Section: Introductionmentioning

confidence: 99%

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

et al. 2011

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This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal-spatial and time-signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein.

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Section: Introductionmentioning

confidence: 99%

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

et al. 2011

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“…A partitioning scheme, in which a signature mismatch is followed by an individual examination of each cell, is utilized for failing scan cell determination. The diagnosis time for determination of failing scan cells with this approach exceeds somewhat that of the method proposed by Rajski and Tyszer [6].…”

Section: Previous Workmentioning

confidence: 90%

“…is chosen to exceed the number of expected faulty cells [6], the existence of at least one fault free partition per partition group is guaranteed.…”

Section: Preliminariesmentioning

confidence: 99%

“…Encoded signatures are attained by utilizing a programmable MISR and failing cells are determined by analyzing the resultant signatures off-line. Rajski and Tyszer propose an LFSRbased partitioning approach for detection of failing scan cells [6]. The proposed scheme utilizes a successive partitioning and elimination approach in order to narrow down possible fault sites.…”

Section: Previous Workmentioning

confidence: 99%

“…A thread of work focuses on failing test vector identification [7,8,1]. An alternative approach targets the identification of scan cells that capture incorrect information during test [9,6,3,2]. A limited set of efforts attacks both problems simultaneously, most notably [5].…”

Section: Previous Workmentioning

confidence: 99%

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