2017
DOI: 10.1103/physrevapplied.8.034020
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Device Physics of Contact Issues for the Overestimation and Underestimation of Carrier Mobility in Field-Effect Transistors

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Cited by 195 publications
(188 citation statements)
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References 40 publications
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“…Transistors are the most widely used devices to extract mobility values due to their convenience. As already mentioned in the Introduction, care should be taken during the extraction of charge transport characteristics, as should be for any measurements . Indeed, the equations used to model an OFET are only valid within the respect of their condition of applications (described later on in this section) in order to avoid misinterpretations, which can easily happen considering the multidisciplinarity of the field of organic electronics.…”
Section: Charge Transportmentioning
confidence: 99%
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“…Transistors are the most widely used devices to extract mobility values due to their convenience. As already mentioned in the Introduction, care should be taken during the extraction of charge transport characteristics, as should be for any measurements . Indeed, the equations used to model an OFET are only valid within the respect of their condition of applications (described later on in this section) in order to avoid misinterpretations, which can easily happen considering the multidisciplinarity of the field of organic electronics.…”
Section: Charge Transportmentioning
confidence: 99%
“…Despite being a routine measurement, this section clearly highlights the mandatory aspects and required conditions to use an OFET as a mobility evaluation technique. Recent papers have indeed rung the bell and raised the question of inflated values . It is only by a general good practice and care of understanding of the underlying principles that reliable extractions and measurements can be performed.…”
Section: Charge Transportmentioning
confidence: 99%
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“…(c)) which leads to a peak of the apparent mobility is attributed to the contact resistance and occurs when there is a large variation of the contact resistance with gate voltage . Depending on the shape of the transfer characteristics, the apparent mobility may underestimate or overestimate the intrinsic mobility. This can be misleading in the process of optimizing material and device fabrication.…”
Section: Ideal Otftmentioning
confidence: 99%
“…The shape of D ( E ) depends on the complex microscopic structure of the OSC and cannot be determined exactly. To overcome this difficulty, the authors considered the diffusion coefficient D ( E ) to be Gaussian‐like with a Gaussian width ΔD . The energetic conductivity in the LUMO band (assuming a Gaussian DOS with a Gaussian width ΔE ) is then described by σE=qμ0N022πΔDΔEexpEELUMO22()ΔDΔE2. …”
Section: Transport Properties and Mobility Modelsmentioning
confidence: 99%