1994
DOI: 10.1021/j100060a034
|View full text |Cite
|
Sign up to set email alerts
|

Development of Surface Acidity in Water-Oxidized Alumina Films: Ethylene Adsorption as a Function of Pretreatment Temperature

Abstract: The structure and surface acidity of thin water-oxidized alumina films on Al( 110) have been studied as a function of film treatment temperature and ethylene adsorption using X-ray photoelectron spectroscopy. The O H content of the oxides decreases monotonically with temperature while the crystallinity increases uniformly to form a polycrystalline y-alumina at 500 'C. Ethylene adsorbed on the oxides identifies the presence of acid sites with a maximum spectral intensity for alumina films pretreated between 350… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

1996
1996
2009
2009

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(4 citation statements)
references
References 4 publications
0
4
0
Order By: Relevance
“…In the following, reference will be made to the "valence band" (VB) of the cluster and to the "valence band maximum" (VBM), neglecting the fact that the cluster orbitals constitute a finite (albeit closely spaced) set of discrete states. Soft-X-ray photoemission spectroscopy (SXPS) data 87 for hydroxylated Al 2 O 3 films on an Al (110) surface (Figure 4b) show a bonding state, for an unknown type of OH site, at about 9 eV below the VBM. Figure 4a shows the density of states (DOS) computed for the 1,4 type IIIb configuration of the Al 32 O 48 cluster (Figure 3b).…”
Section: Surface Electronic Structurementioning
confidence: 99%
See 2 more Smart Citations
“…In the following, reference will be made to the "valence band" (VB) of the cluster and to the "valence band maximum" (VBM), neglecting the fact that the cluster orbitals constitute a finite (albeit closely spaced) set of discrete states. Soft-X-ray photoemission spectroscopy (SXPS) data 87 for hydroxylated Al 2 O 3 films on an Al (110) surface (Figure 4b) show a bonding state, for an unknown type of OH site, at about 9 eV below the VBM. Figure 4a shows the density of states (DOS) computed for the 1,4 type IIIb configuration of the Al 32 O 48 cluster (Figure 3b).…”
Section: Surface Electronic Structurementioning
confidence: 99%
“…The DOS has been broadened with an arbitrarily chosen Gaussian width of 0.27 eV. (b) SXPS data (ref with permission) for an hydroxylated Al 2 O 3 film on Al (110). The energy scale has been shifted by 1.0 eV from that given in the original reference to place the VBM at the foot of the strong peak so as to be consistent with (a).…”
Section: Construction Of γ-Al2o3 Surface Modelsmentioning
confidence: 99%
See 1 more Smart Citation
“…There are several advantages to this approach. First, the thin oxide film deposited onto a metal substrate allows electron-based spectroscopies to be used to interrogate the surface since the film is sufficiently thin that it does not charge [17][18][19][20][21][22][23][24][25][26][27]. In addition, other, non-electron-based techniques, such as reflection-absorption infrared spectroscopy (RAIRS) can also be used.…”
Section: Introductionmentioning
confidence: 99%