2021
DOI: 10.1016/j.spmi.2021.107048
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Design of bevel junction termination extension structure for high-performance vertical GaN Schottky barrier diode

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Cited by 7 publications
(1 citation statement)
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“…The commonly used parallel electric field-dependent mobility model, the Auger recombination model, the Shockley-Read-Hall model, and the impact ionization model were adopted to obtain the current-voltage (I-V ) curve and electric field distribution of the SBDs. [25] In addition, a universal phonon-assisted tunneling model was defined at the anode region. The key mate-rial parameters of diamond and Ga 2 O 3 [26] in the simulations are shown in Table 1.…”
Section: Introductionmentioning
confidence: 99%
“…The commonly used parallel electric field-dependent mobility model, the Auger recombination model, the Shockley-Read-Hall model, and the impact ionization model were adopted to obtain the current-voltage (I-V ) curve and electric field distribution of the SBDs. [25] In addition, a universal phonon-assisted tunneling model was defined at the anode region. The key mate-rial parameters of diamond and Ga 2 O 3 [26] in the simulations are shown in Table 1.…”
Section: Introductionmentioning
confidence: 99%