1993
DOI: 10.1016/0956-7151(93)90191-t
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Deformation processes related to interfacial boundaries in two-phase γ-titanium aluminides

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Cited by 195 publications
(49 citation statements)
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“…Thus, conventional transmission electron microscopy (TEM) imaging techniques have been coupled with high resolution electron microscopy (HREM) to characterize the relevant processes. [8] …”
Section: Experimental Methodsmentioning
confidence: 99%
“…Thus, conventional transmission electron microscopy (TEM) imaging techniques have been coupled with high resolution electron microscopy (HREM) to characterize the relevant processes. [8] …”
Section: Experimental Methodsmentioning
confidence: 99%
“…They have the characteristics of high temperature stability, good creep resistance and relatively high yield strength. 1,2) Their superb properties have found applications in aerospace and automotive applications. 3,4) The interdiffusion and interreaction phenomena of the Ti-Al diffusion couple system have previously been studied in detail.…”
Section: Introductionmentioning
confidence: 99%
“…In PST TiAl crystals, the interfacial dislocations and/or ledges on y/y and ~z/Y lamellar interfaces act as potent sites for twin generation of {111)<112] true-twinning type in 7-TiAl lamellae [6,28,32]. Though not as effective as the lamellar interfaces in PST crystals, grain boundaries in single-phase 7-TiAI polycrystals are observed to be sites of twin nucleation [5,19,31].…”
Section: Discussionmentioning
confidence: 99%