2021
DOI: 10.48550/arxiv.2104.06288
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Carlo P. Sasso,
Giovanni Mana,
Enrico Massa

Abstract: The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the measurement accuracy is approaching nine significant digits, a reliable model of the interferometer operation is demanded to quantify or exclude systematic errors. This paper investigates both analytically and experimentally the effect of defocus (a difference between the splitter-to-mirror distance on the one hand and the analyserto-mir… Show more

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