2016
DOI: 10.1016/j.ultramic.2016.08.016
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Custom sample environments at the ALBA XPEEM

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Cited by 41 publications
(44 citation statements)
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“…MIPR HR0011831554. The XMCD-PEEM experiments were performed at (1) the CIRCE beam line at the ALBA synchrotron [49,50] with the x-axis is found very close to t Co = 0, indicating the absence of a magnetically dead layer, consistently with a previous experimental study [1]. The effective anisotropy was measured using SQUID on a Pt/Co(0.9nm)/MgO film, identical to the sample in which we studied the skyrmion dynamics (same position on the wedge).…”
Section: Discussionmentioning
confidence: 99%
“…MIPR HR0011831554. The XMCD-PEEM experiments were performed at (1) the CIRCE beam line at the ALBA synchrotron [49,50] with the x-axis is found very close to t Co = 0, indicating the absence of a magnetically dead layer, consistently with a previous experimental study [1]. The effective anisotropy was measured using SQUID on a Pt/Co(0.9nm)/MgO film, identical to the sample in which we studied the skyrmion dynamics (same position on the wedge).…”
Section: Discussionmentioning
confidence: 99%
“…The samples are mounted into a custom sample holder [see Fig. 1(d) and Foerster et al (2016)] which includes a printed circuit board (PCB) to provide a platform for wire bonds to the IDT contact pads. Short wire connections between the sample holder feet and the PCB were realized using thin Cu wires and silver paste.…”
Section: Methodsmentioning
confidence: 99%
“…In order to reduce the risk of arcing between the sample and the objective lens, the microscope was operated at a reduced 10 kV main acceleration voltage and samples were degassed in ultrahigh vacuum at low temperatures (< 100 C) for at least 1 h prior to the measurements. The basic electronic system to produce the RF excitation signal for SAWs in the PEEM microscope is described in detail elsewhere (Foerster et al, 2016). It basically consists of an RF function generator to produce an analog sinusoidal signal, which is phase-locked to the synchrotron master clock and can be adjusted in amplitude and phase.…”
Section: Methodsmentioning
confidence: 99%
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“…Higher lateral resolution is achieved with electronbased techniques by using secondary or photo-emitted electrons. Scanning electron microscopy with polarization analysis and X-ray photoemission electron microscopy provide very good lateral resolution ($ 10 nm) but they also have shallow probing depths (1-2 nm) due to strong inelastic scattering of low-energy electrons (Scheinfein et al, 1990;Unguris, 2001;Locatelli & Bauer, 2008;Foerster et al, 2016). This limitation is circumvented for high-energy electrons that traverse samples.…”
Section: Introductionmentioning
confidence: 99%