Abstract:We present a new unit test generator for C code, CTGEN. It generates test data for C1 structural coverage and functional coverage based on pre-/post-condition specifications or internal assertions. The generator supports automated stub generation, and data to be returned by the stub to the unit under test (UUT) may be specified by means of constraints. The typical application field for CTGEN is embedded systems testing; therefore the tool can cope with the typical aliasing problems present in low-level C, incl… Show more
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