1990
DOI: 10.1109/23.55865
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CT image correction for beam hardening using simulated projection data

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1990
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Cited by 39 publications
(16 citation statements)
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“…The new algorithm is robust, also regarding its free parameters, the shape parameter η, and the number of basis images. Since sfEBHC does not require segmentation, because segmentation rather is replaced by a nonlinear operation on the image's gray scale, it may be useful in cases where most other known higher order beam hardening correction approaches, such as, 6,9,10,[15][16][17] for example, may not be applicable.…”
Section: Discussionmentioning
confidence: 99%
“…The new algorithm is robust, also regarding its free parameters, the shape parameter η, and the number of basis images. Since sfEBHC does not require segmentation, because segmentation rather is replaced by a nonlinear operation on the image's gray scale, it may be useful in cases where most other known higher order beam hardening correction approaches, such as, 6,9,10,[15][16][17] for example, may not be applicable.…”
Section: Discussionmentioning
confidence: 99%
“…Despite the availability of sophisticated reconstruction algorithms, empirical corrections are arguably the most widely used class of beam hardening corrections. These can be applied prior to image reconstruction [20, 21], or applied to the reconstructed image by applying polynomial basis functions, linearization procedures, calibration curves, or conversion tables [22-26]. These empirical approaches have been used in laboratory desktop μCT systems with some success, but the polynomial corrections that were used were not perfect and could not completely remove beam hardening artifacts for all cases [27-30].…”
Section: Introductionmentioning
confidence: 99%
“…13 Alternatively, the linearization for multiple material objects can be performed using an iterative post reconstruction (IPR) approach. 1,12,[14][15][16][17][18][19][20][21][22] IPR methods are initialized with a preliminary reconstruction of the data, which is used to estimate the intersection length of each material with each ray path. Using these material thicknesses and prior knowledge about the spectrum and materials, the sinogram can be corrected.…”
Section: Introductionmentioning
confidence: 99%