Crystallographic Polarity of ZnO Crystals

Mariano, Anthony N.; Hanneman, R. E.

doi:10.1063/1.1702617

Cited by 309 publications

(163 citation statements)

References 9 publications

Supporting

Mentioning

159

Contrasting

Order By: Relevance

“…The (0001) and (0001) polar faces were identified oy etching with nitric -acid, using the procedure described by Mariano and Hanneman. 8 The surfaces were mechanically polished until optically smooth using 0.25 J.Lm diamond paste. The surface was cleaned in vacuum by sputtering with a 500 V Art ion beam followed by annealing at 950 K. This procedure was repeated until no im- purities were detected using AES or HREELS and the surface exhibited a sharp 1 X 1 hexagonal LEED pattern.…”

Section: Methodsmentioning

confidence: 99%

Interaction of platinum films with the (0001̄) and (0001) surfaces of ZnO

Petrie¹,

Vohs²

1994

The Journal of Chemical Physics

View full text Add to dashboard Cite

In this investigation, the growth, structure, and electronic properties of Pt films on the polar surfaces of ZnO were examined using high-resolution electron energy-loss spectroscopy (HREELS) and low-energhy, electron diffraction (LEED). The growth mode of vapor-deposited Pt films on ZnO(0001#) and ZnO(0001) at 300 K was found to be nearly layer-by-layer. The surfaces of Pt films produced in this manner exhibited hexagonal symmetry and were stable up to 600 K. At higher temperatures, the Pt agglomerated into particles which remained oriented with respect to the ZnO substrate. HREELS results indicate that there are only weak interactions at the Pt/ZnO(0001#) interface, while charge transfer and Schottky barrier formation occures at the Pt/ZnO (0001) In this investigation, the growth, structure, and electronic properties of Pt films on the polar surfaces of ZnO were examined using high-resolution electron energy-loss spectroscopy (HREELS) and low~energy, electron diffraction (LEED). The growth mode of vapor-deposited Pt films on ZnO(OOOl) and ZnO(OOOl) at 300 K was found to be nearly layer-by-layer. The surfaces ofPt films produced in this manner exhibited hexagonal symmetry and were stable up to 600 K. At higher temperatures, the Pt agglomerated into particles which remained oriented with respect to the ZnO substrate. HREELS results indicate that there are only weak interactions at the PtlZnO(OOOl) interface, while charge transfer and Schottky barrier formation occurs at the PtlZnO(OOOl) interface.

show abstract

Section: Methodsmentioning

confidence: 99%

Interaction of platinum films with the (0001̄) and (0001) surfaces of ZnO

Petrie¹,

Vohs²

1994

The Journal of Chemical Physics

View full text Add to dashboard Cite

show abstract

“…The two faces are known to be structurally and chemically different. 1,2 They have been identified by x-ray diffraction, low energy electron diffraction, 3 photoelectron diffraction, 4 coaxial impact-collision ion scattering spectroscopy, 5 the sign of the piezoelectric coefficient, and etch rate measurements in HCl or H 2 NO. 6 In the current paper we compare photoluminescence ͑PL͒ measurements on the two polar faces of ZnO.…”

Section: Introductionmentioning

confidence: 99%

Photoluminescence measurements from the two polar faces of ZnO

Sherriff

Reynolds

Look

et al. 2000

Journal of Applied Physics

View full text Add to dashboard Cite

The crystal structure of ZnO is wurtzite and the stacking sequence of atomic layers along the ''c'' axis is not symmetric. As a result, a ZnO crystal surface that is normal to the c axis exposes one of two distinct polar faces, with ͑0001͒ being considered the O face and ͑0001͒ the Zn face. Photoluminescence ͑PL͒ measurements on the two faces reveal a striking difference. Two transitions are observed in PL that are dominant from the O face and barely observed in PL from the Zn face. These lines are identified as phonon replicas of a particular D 0 ,X transition using energy separations, excitation dependence, and time-resolved PL measurements. In addition, PL emission from free excitons is found to be more intense from the O face than from the Zn face.

show abstract

“…The polarity of each domain is identified simply by the shape of chemically induced etch pits without recourse to detailed high resolution electron diffraction studies 9,15,16 because the chemical reactivity of ZnO crystals depends significantly on their crystallographic orientation. 16,17 A triangular shape of etch pits in the inset figures clearly shows that only head-to-head IBs are present in SBZ while tail-to-tail ones in TBZ.…”

mentioning

confidence: 97%