1999
DOI: 10.1021/la9815446
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Correlation of Relative X-ray Photoelectron Spectroscopy Shake-up Intensity with CuO Particle Size

Abstract: X-ray photoelectron spectroscopy (XPS) analysis of four Cu/SiO2 catalyst systems of different particle sizes of CuO on the surface showed variation in the relative peak area intensities of the shake-up lines to main core levels of the Cu 2p orbitals. These differences were attributed to various degrees of XPS-induced reduction of CuO initially formed on the surface by spin coating copper(II) acetate {Cu-(CH3CO2)2‚H2O, Cu(ac)2} solutions of varying concentration. Changes in Cu L3M4,5M4,5 X-ray excited Auger (XA… Show more

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Cited by 391 publications
(219 citation statements)
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“…Figure 2(b) shows the Cu 2p XPS spectrum, where the copper acetate treated SnO 2 sample shows a main Cu 2p3/2 peak at 934.2 eV and broad feature of satellite peak centered at 942.1 eV, which is indicative of Cu 2+ species with 3d 9 configuration. [19][20][21] It was reported that the Cu 2p3/2 XPS spectrum for the CuO thin amorphous layer of about 5 Å thick on the Cu 2 O core material had a main peak at 934.6 eV with a series of satellites on the high-binding-energy side, 940.3 and 943.1 eV. 22 Our XPS result indicates that the surface coating of copper acetate results in CuO layer with Cu 2+ state.…”
Section: Resultsmentioning
confidence: 58%
“…Figure 2(b) shows the Cu 2p XPS spectrum, where the copper acetate treated SnO 2 sample shows a main Cu 2p3/2 peak at 934.2 eV and broad feature of satellite peak centered at 942.1 eV, which is indicative of Cu 2+ species with 3d 9 configuration. [19][20][21] It was reported that the Cu 2p3/2 XPS spectrum for the CuO thin amorphous layer of about 5 Å thick on the Cu 2 O core material had a main peak at 934.6 eV with a series of satellites on the high-binding-energy side, 940.3 and 943.1 eV. 22 Our XPS result indicates that the surface coating of copper acetate results in CuO layer with Cu 2+ state.…”
Section: Resultsmentioning
confidence: 58%
“…32 The satellite peaks indicate the formation of CuO. 33 These results are cross matched with the results of XRD. The Cu 2p 3/2 peaks were curve fitted with three species corresponding to Cu 2 O (933.20 eV, FWHM: 1.56 eV), CuO (934.34 eV, FWHM: 1.56 eV) and Cu(OH) 2 (935.61 eV, FWHM: 1.67 eV).…”
Section: 31mentioning
confidence: 54%
“…[21][22][23] Additionally, the "shake-up" satellites at approximately 945 eV and 965 eV for the Cu 2p 3/2 and 2p 1/2 core levels, respectively, are associated with the existence of Cu 2+ . 19,27 The XRD, TGA, and XPS results demonstrate the occurrence of chemical bonds between Cu and S in the electrode with Cu as the current collector, which indicates that the S is not only physically loaded on the Cu current collector but also chemically interacts with the Cu substrate by forming of copper sulfides with the mixed valence states of Cu 1+ and Cu 2+ ions. As is widely known, S and polysulfide intermediates are nonconductive and their electrochemical reactions only occur when the S loading thickness on the conductive matrix is within an electron tunneling range.…”
Section: Resultsmentioning
confidence: 98%