“…Indeed, reactive HiPIMS discharges, even in the absence of an applied substrate bias, are well-known to provide ion-assisted growth, where the deposited flux is composed to a large fraction of metal ions having an average kinetic ion energies of 15-20 eV and a neutral sputtered flux with a kinetic energy of 2 eV. 57,58 The use of a continuous substrate bias, here -100V, can provide additional kinetic energy (+100 eV) to the incident ions species at the substrate surface, resulting in a higher adatom mobility during the film growth and ultimately leads to a reduction of intracolumnar as well as intercolumnar porosity, as shown by Petrov et al 47 Under such conditions, dense Ni 1-x Si x N y films can be grown even in the absence of substrate heating, which corresponds to zone 3 in the extended structure zone diagram, where energetic ion bombardment is taken into account. 59 Films grown with very low N content, i.e.…”