volume 111, issue 1, P59-64 1982
DOI: 10.1002/pssb.2221110105
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Abstract: The XXR line shift contributions originating from demagnetizing fields due to classical macroscopic magnetic effects are discussed for ellipsoidal samples. It is shown that by measuring the line shifts along two main axes of the ellipsoid, the measured difference is sufficient to correct for demagnetizing effects in materials with homogeneous magnetization. It is also found that for special sample geometries even the demagnetizing factors are unnecessary for calculating the demagnetization correction term. Ba…

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