2017 1st International Conference on Electronics, Materials Engineering and Nano-Technology (IEMENTech) 2017
DOI: 10.1109/iementech.2017.8076987
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Convolutional Neural Network based face detection

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Cited by 7 publications
(4 citation statements)
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“…A comparison is performed in a tabular manner in this paper, so that it is easier to understand the algorithms in a better and easier manner. S. Mukherjee et al [6], in this paper discusses about two different techniques that are used for face detection in frames which contain humans. The old approach of using hand crafted features followed by training a simple classifier and a relatively new approach of learning features form data with the help of neural network.…”
Section: Literature Surveymentioning
confidence: 99%
“…A comparison is performed in a tabular manner in this paper, so that it is easier to understand the algorithms in a better and easier manner. S. Mukherjee et al [6], in this paper discusses about two different techniques that are used for face detection in frames which contain humans. The old approach of using hand crafted features followed by training a simple classifier and a relatively new approach of learning features form data with the help of neural network.…”
Section: Literature Surveymentioning
confidence: 99%
“…Recently, convolutional neural networks (CNNs) achieve remarkable progresses in a variety of computer vision tasks [25,26,27]. Taking image classification [17,23] and face recognition [18] [29] have discussed the formulation for both the methods, i.e., using hand-crafted features followed by training a simple classifier and an entirely modern approach of learning features from data using neural networks. Ren et al [30] have presented a method for real time detection and tracking of the human face.…”
Section: Face Detectionmentioning
confidence: 99%
“…Mukherjee et al. [29] have discussed the formulation for both the methods, i.e., using hand‐crafted features followed by training a simple classifier and an entirely modern approach of learning features from data using neural networks. Ren et al.…”
Section: Related Workmentioning
confidence: 99%
“…However, methods that can be applied to URTA are very limited, especially under a plasma process. Conventionally, contact-type methods, such as thermocouples 2,3) and thermo-labels, 4) need to come into contact with the wafer and are typically pasted to either the backside of the wafer or the wafer chuck. Thus, contact thermal resistance between the wafer and the probe will inevitably affect measurements.…”
Section: Introductionmentioning
confidence: 99%