Preparation of CuI single crystals was undertaken to avoid the limited grain size and random in-plane orientation in previously presented CuI thin fi lms. The crystals exhibited hexagonal or triangular habit from slow growth in saturated acetonitrile solution ( Figure 1 a). This is indicative of expression of threefold or sixfold planar symmetry in the top faces of these crystals suggestive of (111) orientation. For surface analysis by low energy electron diffraction (LEED), crystals were mounted on Ta sample plates and loaded into UHV where diffraction patterns were collected without any surface preparation. LEED showed a hexagonal arrangement of spots consistent with a 1 × 1 (111) pattern with no additional spots at lower energies (Figure 1 b). Additionally, X-ray diffraction (XRD) patterns were recorded (in ambient conditions) after careful alignment to the surface normal of the crystal and only {111} refl ections were observed (Figure 1 c). Atomic force microscopy (AFM) images (collected in ambient air) showed that the top faces were fl at with 60° rotational symmetry in their step edge arrangement ( Figure 2 a, b). The combination of these experimental observations established that the crystals are of high quality and possess large exposed (111) top surfaces.Thin fi lms (50 nm thickness) of VOPc were prepared on these surfaces by evaporation at elevated substrate temperature ( T sub = 155 °C). To determine if growth at this temperature resulted in any changes to the CuI single crystal, a control experiment was performed in which the crystal was annealed for 1 h at growth temperature. The resulting LEED pattern was unchanged suggesting no change in the surface crystal structure ( Figure S1, Supporting Information) in agreement with previous high-temperature structural studies. [ 13 ] The crystal structure and surface morphology of the resultant VOPc fi lms were analyzed using XRD and AFM, respectively. Diffraction patterns ( Figure 3 a) exhibit only a single peak which can be indexed as (132) using the VOPc single crystal structure and is the only feature differentiating the VOPc/CuI pattern from that of the bare CuI (111) crystal. In order to ascertain whether a single orientation of VOPc was present, Rietveld refi nement was undertaken on the VOPc/CuI XRD data. The CuI and VOPc were both fi tted with March-Dollase preferred orientation with a March factor of 0.001 (corresponding to 99.9% orientation) around the CuI (111) and VOPc (132) directions, respectively ( Figure S2, Supporting Information). [ 14,15 ] The lack of any other peaks (even those with higher structure factors) which would be expected from the isotropic VOPc powder pattern confi rms a singly oriented fi lm. The (132) plane of the VOPc structure corresponds to a molecular orientation in which the ligand plane of the molecule is normal to the surface as demonstrated in Figure 3 b.Structural templating is a well-established method to infl uence the morphologies and structures of organic semiconductor thin fi lms and therefore control their ele...