Contact resonances in voltage-modulated force microscopy

Harnagea, Cătălin; Alexe, Marin; Hesse, D.; Pignolet, A.

doi:10.1063/1.1592307

Cited by 120 publications

(111 citation statements)

References 16 publications

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“…These frequency behaviors were explored by a number of authors. 95,[182][183][184] At low frequencies the frequency dispersion of the transfer function is relatively small and is primarily associated with the non-idealities of the cantilever design. Practically, variations of 10-20% (or more) are common, allowing establishing piezoelectric properties within this order of magnitude.…”

Section: Iic Complex Excitations and Spectroscopiesmentioning

confidence: 99%

“…The nonlocal electrostatic forces were studied by Harnagea et al, 95 who explored the frequency dependence of the piezoelectric and electrostatic contributions to the PFM signal, in addition to the effect of the loading force. Further work on exploring the signal formation mechanisms, resolution theory, cross-talk and environmental effects came from Kalinin and Jesse.…”

Section: Iia Basic Pfmmentioning

confidence: 99%

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Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Vasudevan

Balke

Maksymovych

et al. 2017

Applied Physics Reviews

264

206

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Ferroelectric materials have remained one of the foci of condensed matter physics and materials science for over 50 years. In the last 20 years, the development of voltage-modulated scanning probe microscopy techniques, exemplified by Piezoresponse force microscopy (PFM) and associated time-and voltage spectroscopies, opened a pathway to explore these materials on a single-digit nanometer level. Consequently, domain structures, walls and polarization dynamics can now be imaged in real space. More generally, PFM has allowed studying electromechanical coupling in a broad variety of materials ranging from ionics to biological systems. It can also be anticipated that the recent Nobel prize 1 in molecular electromechanical machines will result in rapid growth in interest in PFM as a method to probe their behavior on single device and device assembly levels. However, the broad introduction of PFM also resulted in a growing number of reports on nearly-ubiquitous presence of ferroelectric-like phenomena including remnant polar states and electromechanical hysteresis loops in materials which are non-ferroelectric in the bulk, or in cases where size effects are expected to suppress ferroelectricity. While in certain cases plausible physical mechanisms can be suggested, there is remarkable similarity in observed behaviors, irrespective of the materials system. In this review, we summarize the basic principles of PFM, briefly discuss the features of ferroelectric surfaces salient to PFM imaging and spectroscopy, and summarize existing reports on ferroelectric-like responses in non-classical ferroelectric materials. We further discuss possible mechanisms behind observed behaviors, and possible experimental strategies for their identification.3

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Section: Iic Complex Excitations and Spectroscopiesmentioning

confidence: 99%

Section: Iia Basic Pfmmentioning

confidence: 99%

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Vasudevan

Balke

Maksymovych

et al. 2017

Applied Physics Reviews

264

206

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“…17,18,19 Imaging ferroelectric materials in the vicinity of a phase transition at small probing biases or imaging of biological systems with weak electromechanical coupling require optimal imaging conditions to be established, and a number of approaches based on using contact resonances in PFM have been suggested. 20,21 Finally, it is recognized that the use of the cantilever coupled with a beam-deflection detection system typical for most commercial AFM s does not allow longitudinal and normal force components to be unambiguously distinguished, 12,22 and it has been suggested that operation at specific frequencies would allow these components to be differentiated. 22 In our previous publications, we presented in-depth analysis of the static (low frequency) PFM imaging mechanism and demonstrated approaches for data interpretation and visualization.…”

Section: Introductionmentioning

confidence: 99%

Dynamic behaviour in piezoresponse force microscopy

Jesse

Baddorf

Kalinin³

2006

Nanotechnology

113

114

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Frequency dependent dynamic behavior in Piezoresponse Force M icroscopy (PFM ) implemented on a beam-deflection atomic force microscope (AFM ) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the bending and torsion of the cantilever, detected as vertical and lateral PFM signals.The relative magnitudes of these contributions depend on geometric parameters of the system, the stiffness and frictional forces of tip-surface junction, and operation frequencies. The dynamic signal formation mechanism in PFM is analyzed and conditions for optimal PFM imaging are formulated. The experimental approach for probing cantilever dynamics using frequency-bias spectroscopy and deconvolution of electromechanical and electrostatic contrast is implemented. * Corresponding author, sergei2@ornl.gov 2

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“…This technique has been used in an exhaustive manner to understand nanoscale ferroelectric domain structure, 3-9 polarization relaxation, 10-14 domain-wall creep, 15 piezoelectric properties, [16][17][18][19][20] scaling effects, 17,21,22 reliability issues, 23,24 and properties of individual grains. 25 Although there are reports that correlate piezoresponse of the ferroelectric thin film to the possible crystallographic orientations, 7,26,27 there is scarce information on how the crystallography of each individual grain affects the polarization relaxation.…”

mentioning

confidence: 99%

Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments

Valanoor

Aggarwal

Gruverman

et al. 2005

Applied Physics Letters

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In this letter, we report on the study of nanoscale polarization relaxation phenomena in polycrystalline PbZr0.4Ti0.6O3 films. Piezoresponse force microscopy (PFM) images of the as-grown sample reveal grains with a range of contrast, from fully white to gray to fully black. It is shown that this local change in the contrast (magnitude) of the piezoresponse from grain to grain can be attributed to the crystallographic orientation within each grain. PFM-based relaxation experiments show that the rate of relaxation is different for each grain, furthermore it is strongly dependent on the tilt of individual crystallographic orientation with respect to the polar axis. Strongly tilted away nonpolar axis grains show a much stronger decay of the polarization compared to polar axis-oriented grains. Therefore, for an ensemble of grains under a common top electrode, the relaxation events would first take place in grains, which are nonpolar axis oriented.

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Contact resonances in voltage-modulated force microscopy

Cited by 120 publications

References 16 publications

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Dynamic behaviour in piezoresponse force microscopy

Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments

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