1973
DOI: 10.1107/s0021889873008332
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Computerization of Ruland's X-ray method for determination of the crystallinity in polymers

Abstract: This gives 0~t=162.8+0.2°K for the thin film and 0M = 202 _+ 11 °K for the thick film. ConclusionsAfter the 2-beam correction for dynamical scattering is applied, the difference between the slopes for the small and large particles has become even larger. Three explanations seem to be possible, (i) the Debye temperature 0M, for the small crystallites is lower because of surface, contributions, (ii) 0M for the bigger crystallites is higher because of the inclusion of impurity atoms in the film and (iii) the temp… Show more

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Cited by 354 publications
(239 citation statements)
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“…For the slit geometry typically encountered in Kratky cameras, ['b/lb ~---0"05 [when Wt(0) = 0.5 h]. Empirically, the angular dependence of ['b was found to obey the following relation fairly well (Vonk, 1973;Todo, Hashimoto & Kawai, 1978;Hashimoto, Shibayama & Kawai, 1980) Ib=a+bs"…”
Section: A Structure Containing Spherical Particlesmentioning
confidence: 86%
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“…For the slit geometry typically encountered in Kratky cameras, ['b/lb ~---0"05 [when Wt(0) = 0.5 h]. Empirically, the angular dependence of ['b was found to obey the following relation fairly well (Vonk, 1973;Todo, Hashimoto & Kawai, 1978;Hashimoto, Shibayama & Kawai, 1980) Ib=a+bs"…”
Section: A Structure Containing Spherical Particlesmentioning
confidence: 86%
“…Error in the estimated background can arise not only because of the scatter in the data, but also because the valid analytical form for the background intensity curve is usually not known. Several workers (Vonk, 1973;Todo, Hashimoto & Kawai, 1978;Hashimoto, Shibayama & Kawai, 1980; found the empirical equation (21) to fit the observed background fairly well, while Rathje & Ruland (1976) and Wiegand & Ruland (1979) …”
Section: B Effect Of Erroneous Background Subtractionmentioning
confidence: 99%
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“…The diffraction data were integrated using GADDS software and the output data further analyzed using a crystallinity calculation program based on the Vonk method (Vonk, 1973).…”
Section: Biochemical Analysesmentioning
confidence: 99%
“…Degrees of crystallinity (X c ) of the polymeric films were calculated from diffracted intensity data according to the method proposed by Vonk. 33 The tensile strength at break and elongation at break for the same thin films as used in the X-ray analysis were determined using a tensile strength machine (Eztest; Shimadzu Corporation) at a crosshead speed of 10 mm min À1 . Gauge length and sample width were 5.0 and 2.0 mm, respectively.…”
Section: Characterization Of Phb Silk Protein and Their Complexesmentioning
confidence: 99%