Computed tomography part I: Introduction and industrial applications

Copley, David C.; Eberhard, Jeffrey W.; Mohr, Gregory

doi:10.1007/bf03222531

Cited by 36 publications

(16 citation statements)

References 3 publications

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“…• física atómica, física molecular, • física de materia condensada, [Bu03], [So98] • ciencias de materiales, [Co94], [Po97], [Sp01] • estudios de superficies, • nanotecnología,…”

Section: Aplicacionesunclassified

Aceleradores para Colombia

Moreno

2014

Rev. Acad. Colomb. Cienc. Ex. Fis. Nat.

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Gómez Moreno, B.: Aceleradores de Partículas para Colombia. Rev. Acad. Colomb. Cienc. 38 (Supl.): [71][72][73][74][75][76][77][78][79][80][81][82][83][84][85][86][87][88] 2014. ISSN 0370-3908. ResumenSe presentan los fundamentos y desarrollo histórico de los aceleradores de partículas, detallando en el sincrotrón, en el principio de estabilidad de fase, principio de sincrotrón. Se introducen los anillos de almacenamiento, acumuladores como sincrotrones de campo magnético constante. Para sincrotrones de electrones, se presenta la radiación de sincrotrón y el aprovechamiento de esta radiación con los onduladores como fuentes de rayos-X. Se destacan las propiedades de la radiación de onduladores para aplicaciones en ciencias, tecnologías e industria. Esto motiva para presentar una propuesta de un centro de radiación de sincrotrón para Colombia, con sincrotrón de electrones en modo de anillo de almacenamiento y onduladores como emisores de rayos-X, con múltiples aplicaciones para investigación, desarrollo e innovación en ciencia, tecnología e industria.Palabras clave: Aceleradores de partículas, sincrotrones, radiación de sincrotrón, onduladores. Particle accelerators for colombia AbstractThe foundations and historical development of particle accelerators are presented in this article, detailing on the synchrotron, the principle of phase stability, synchrotron principle. Storage rings, synchrotrons at constant magnetic field, are introduced. For the electron synchrotron, synchrotron radiation is presented and how to exploit it with the use of undulators as X-ray sources. Radiation properties of undulators are highlighted for applications in science and industry. This motivates to present a proposal for a synchrotron radiation center for Colombia with an electron synchrotron operating as storage ring and undulators as X-ray emitters, for multiple applications for research, development and innovation in science, technology and industry.Key words: Particle accelerators, synchrotrons, synchrotron radiation, undulators. Ciencias físicas IntroducciónEn el mundo de los aceleradores de partículas de hoy existen aproximadamente unos 15000 aceleradores. De ellos la gran mayoría son instalaciones comerciales que se encuentran en hospitales y están dedicadas exclusivamente a la medicina nuclear, para diagnóstico, terapia y para la producción de isótopos radioactivos de múltiples aplicaciones en la medicina. Hay también aceleradores de aplicación en la industria en los países desarrollados y, claro está, también los institutos de investigación y laboratorios en las diversas ciencias naturales cuentan con sus propios aceleradores, principalmente en la física nuclear y en la física de altas energías, donde se destacan las mayores instalaciones del mundo como el Laboratorio CERN 1 en Ginebra, Suiza.

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Section: Aplicacionesunclassified

Aceleradores para Colombia

Moreno

2014

Rev. Acad. Colomb. Cienc. Ex. Fis. Nat.

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“…[18][19][20][27][28][29][30] A typical level of slice thickness for X-ray CT is from 0.025 mm to 3 mm, with pixel sizes in the range of 0.025 mm to 1 mm. [27,31,32] In this research, all X-ray CT slices are 0.25 mm in thickness and 0.028 mm in pixel size. Figure 5 illustrates an X-ray CT setup for obtaining an X-ray CT scan image along the width direction (Y-Z plane) of the sample.…”

Section: X-ray Ct For As-machined Cfcc Couponsmentioning

confidence: 99%

Tensile Fracture Behavior of Nicalon/SiC Composites

Kim

Liaw

2007

Metall Mater Trans A

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The tensile behavior of Nicalon fiber-reinforced silicon carbide matrix composites (Nicalon/SiC) was investigated with the aid of nondestructive evaluation (NDE) techniques. The NDE techniques include ultrasonic testing (UT), X-ray computed tomography (CT), and infrared (IR) thermography. Before mechanical testing, UT C-scans were developed to investigate defect distributions and to detect variations in the internal flaws. X-ray CT was used to characterize the type of defects and the location of flaws in composites to compare with UT C-scan results. The IR thermography was employed to monitor temperature evolution during tensile testing. This article also investigated the feasibility of using multiple NDE techniques as a means of assessing integrity for Nicalon/SiC composites. Microstructural characterization was performed using scanning electron microscopy (SEM) to investigate failure mechanisms of Nicalon/SiC composites, and the results were compared with NDE data.

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“…The X-ray tomography records X-ray attenuation as a function of angle of rotation to produce a two-dimensional image. [1,2,3,[4][5][6][7][8][9][10] The X-ray tomography can be used to reconstruct the three-dimensional morphology and, in some cases, chemical distributions within a material. Using synchrotron radiation, a spatial resolution down to 1 m can be obtained.…”

Section: Comparison Of Tomographic Techniquesmentioning

confidence: 99%

Focused ion-beam tomography

Kubis

Shiflet

Hull

et al. 2004

Metall Mater Trans A

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The focused ion beam (FIB) has become an important tool in materials science for studying and modifying materials systems at the micro and nanometer levels. The technique, due to its ability to perform precision in-situ milling, has been extended to studying three-dimensional structural and chemical relationships. With the help of computer algorithms for processing data and graphics packages for display, three-dimensional systems can easily be reconstructed and the structure interrogated to obtain both qualitative and quantitative information. It is possible to study features at spatial resolutions at the tens-of-nanometers level and volumes with dimensions of up to tens of microns. This allows the reconstruction of many systems in the size range important to nanotechnology. Practical aspects of FIB tomography will be presented, emphasizing data collection, image processing, creating threedimensional volumes, and extracting quantitative information.

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Computed tomography part I: Introduction and industrial applications

Cited by 36 publications

References 3 publications

Aceleradores para Colombia

Aceleradores para Colombia

Tensile Fracture Behavior of Nicalon/SiC Composites

Focused ion-beam tomography

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