Superlattices and Microstructures volume 44, issue 4-5, P385-394 2008 DOI: 10.1016/j.spmi.2008.01.013 View full text
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I.D. Desnica-Frankovic, K. Furić, U. Desnica, P. Dubček, M. Buljan, S. Bernstorff

Abstract: Here we report the comparative analysis of Raman scattering and Grazing incidence small angle scattering of X-rays (GISAXS) applied on the systems of Ge and II-VI compound quantum dots (QDs) embedded in dielectric matrix. In Raman scattering, the synthesis of QDs, their phase and composition, as well as crystal quality, were determined by analyzing the material-related characteristic optical phonon modes. Additionally, from the analysis of the low frequency vibrational Raman band, the size and size distributi…

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