2018
DOI: 10.1109/led.2018.2868275
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Compatibility of HfN Metal Gate Electrodes With Hf0.5Zr0.5O2 Ferroelectric Thin Films for Ferroelectric Field-Effect Transistors

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Cited by 58 publications
(38 citation statements)
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“…According to the results, the transfer curve obviously shifts to positive direction after program process (+5 V, 1s) and to negative direction after erase process (−5 V, 1s). The low operation voltage (program/erase operation: ± 5 V) is comparable with other works . For the synaptic device with 1 mg mL −1 Zn‐TCPP, the threshold voltage ( V T ) moves from −2.06 V (initial state) to −1.29 V under +5 V (programming), and then to −2.36 V under −5 V (erasing), leading to a memory window (Δ V T ) of 1.07 V. For the synaptic device with 2 mg mL −1 Zn‐TCPP, the V T moves from −1.71 V (initial state) to −0.51 V under +5 V (programming), and then to −1.95 V under −5 V (erasing), leading to a higher Δ V T (1.44 V).…”
Section: Resultssupporting
confidence: 78%
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“…According to the results, the transfer curve obviously shifts to positive direction after program process (+5 V, 1s) and to negative direction after erase process (−5 V, 1s). The low operation voltage (program/erase operation: ± 5 V) is comparable with other works . For the synaptic device with 1 mg mL −1 Zn‐TCPP, the threshold voltage ( V T ) moves from −2.06 V (initial state) to −1.29 V under +5 V (programming), and then to −2.36 V under −5 V (erasing), leading to a memory window (Δ V T ) of 1.07 V. For the synaptic device with 2 mg mL −1 Zn‐TCPP, the V T moves from −1.71 V (initial state) to −0.51 V under +5 V (programming), and then to −1.95 V under −5 V (erasing), leading to a higher Δ V T (1.44 V).…”
Section: Resultssupporting
confidence: 78%
“…The diagrams consist of semiconductor layer (pentacene), tunneling layer (PVPy), and charge trapping layer (Zn‐TCPP nanosheets). According to previous works, the conduction band bottom (CBB) and VBM of PVPy are 2.8 and 6.2 eV, and the HOMO and LOMO levels of pentacene are 5.2 and 3.1 eV 9,21c. Based on the UPS and UV–vis results of Zn‐TCPP nanosheets in Figure d and Figure S11, Supporting Information, the VBM and CBB are measured to be about 5.1 and 3.1 eV.…”
Section: Resultsmentioning
confidence: 63%
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“…Meanwhile, TaN/HZO/TaN and TaN/HZO/ZrO 2 /TaN capacitors were also fabricated to evaluate the ferroelectric properties of the HZO thin films. The polarization–voltage ( P–V ) hysteresis loops of the capacitors were measured using a Radiant Technologies RT66A ferroelectric test system, while the device characteristics of FeFETs were measured by an Agilent B1500A semiconductor device analyzer with a pulse generator unit (B1525A) [20]. Two main test sequences used for MW and endurance measurements are shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Future device design should encompass an optimized gate stack with larger HZO/SiO 2 ratio and a cross‐section with nanosheet shape and flat sidewalls. Furthermore, TiN or novel HfN [ 37 ] metal gate electrodes shall be adopted, for improved remanent polarization.…”
Section: Figurementioning
confidence: 99%