Comparisons of total energy and peak power diagnostics for low-radiation-temperature soft x-ray source at an 8-MA facility

Abstract

Routine diagnostics of total x-ray energy and peak power at an 8-MA pulsed-power generator in China will be described, together with calibrations. Successfully measurements with those diagnostics in Z-pinch dynamic hohlraum at low radiation temperature of ∼ 70 eV were provided. Also presented are results from a flat response x-ray diode (XRD) for comparison. It is found that, in such an application, total x-ray energy from free-standing (FS) bolometer agrees well with that by scintillant power meter (SPM), but twice higher than that by XRD. This discrepancy lies in low spectral sensitivity of the flat response XRD and diffraction effect of pinhole array at low energy, confirmed by calculation and calibration. X-ray peak power from SPM agrees with that from XRD and diamond photo-conducting detector (PCD) within 10% and 20% deviation, respectively. We suggest that the SPM would be the preferred choice for both measurements for diagnosing low-radiation-temperature x-ray source. K: X-ray detectors; Nuclear instruments and methods for hot plasma diagnostics; Detector alignment and calibration methods (lasers, sources, particle-beams) 1Corresponding author.