2008
DOI: 10.1016/j.apsusc.2008.02.108
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Comparison and semiconductor properties of nitrogen doped carbon thin films grown by different techniques

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Cited by 17 publications
(11 citation statements)
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“…There are several reported methods of preparing nitrogen‐doped carbons using different sources of nitrogen. For example, Ismagilov et al used ammonia gas to serve as nitrogen source during the decomposition of ethylene gas on a 65Ni‐25Cu‐10Al 2 O 3 catalyst, while Alibart et al prepared N‐doped carbon thin‐films by different sputtering techniques in a mixed Ar/N 2 atmosphere. Furthermore, a helium atmosphere loaded with pyrrole gas was used during an arc discharge vaporization of carbon rods leading to N‐doped carbon with improved conductivity …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…There are several reported methods of preparing nitrogen‐doped carbons using different sources of nitrogen. For example, Ismagilov et al used ammonia gas to serve as nitrogen source during the decomposition of ethylene gas on a 65Ni‐25Cu‐10Al 2 O 3 catalyst, while Alibart et al prepared N‐doped carbon thin‐films by different sputtering techniques in a mixed Ar/N 2 atmosphere. Furthermore, a helium atmosphere loaded with pyrrole gas was used during an arc discharge vaporization of carbon rods leading to N‐doped carbon with improved conductivity …”
Section: Introductionmentioning
confidence: 99%
“…In the case of N‐doped carbons, the enhancement of conductivity and growth of the graphene stacks with increasing carbonization temperature is counteracted by the release of nitrogen: the higher the carbonization temperature the stronger the volatilization of nitrogen containing molecules from the material. [13a] Nitrogen being integrated into the polyaromatic structure influences the overall conductivity, as it is known that inserted nitrogen modifies the electronic band structure of various carbon morphologies such as flakes,[3c] thin films, fibers, and carbon nanotubes (CNTs) . For the latter, it was demonstrated that the density of states of charge carriers D ( E F ) at the Fermi level increases through appropriate nitrogen doping.…”
Section: Introductionmentioning
confidence: 99%
“…[20] The bnding in amorphous carbon nitride was summarized elsewhere. [21,22] There have been several reports on a-C/a-CN x thin film transistors (TFTs),…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, the shift of the Raman peaks towards lower frequencies and the decrease in the I D /I G intensity ratio can be explained by either some increase in the sp 3 bonding fraction, or the decrease in the size of the graphitic clusters [41][42][43][44]. The latter case is the one which is believed to be more likely to take place.…”
Section: Raman Spectroscopy Measurementsmentioning
confidence: 96%