2022
DOI: 10.1016/j.apsusc.2022.154630
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Combining advanced photoelectron spectroscopy approaches to analyse deeply buried GaP(As)/Si(1 0 0) interfaces: Interfacial chemical states and complete band energy diagrams

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Cited by 5 publications
(6 citation statements)
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“…Such a broadening can arise from changes in chemical structure (i.e., formation of new species beneath the HTM) or electronic structure profiles. Due to the relatively high information depth of HAXPES measurements, probing a sample volume in which band bending occurs may result in a line broadening rather than or in addition to a shift in peak position. As discussed above, we do not see any indications of pronounced chemical changes in the CsPbI 3 films.…”
Section: Resultsmentioning
confidence: 99%
“…Such a broadening can arise from changes in chemical structure (i.e., formation of new species beneath the HTM) or electronic structure profiles. Due to the relatively high information depth of HAXPES measurements, probing a sample volume in which band bending occurs may result in a line broadening rather than or in addition to a shift in peak position. As discussed above, we do not see any indications of pronounced chemical changes in the CsPbI 3 films.…”
Section: Resultsmentioning
confidence: 99%
“…It includes PES depth-profiling methods for which ion gun etching cycles and PES measurements are alternated. [19,20,22] In these works, Romanyuk et al combined XPS with Ar gas cluster ion beam sputtering, they studied the GaP/Si(001) interface and the addition of As to suppress the formation of antiphase domains. [20,22] The top-down approach also includes the more recent TCS-PES method.…”
Section: Introductionmentioning
confidence: 99%
“…[19,20,22] In these works, Romanyuk et al combined XPS with Ar gas cluster ion beam sputtering, they studied the GaP/Si(001) interface and the addition of As to suppress the formation of antiphase domains. [20,22] The top-down approach also includes the more recent TCS-PES method. A TCS is a very low-angle cross section that is extended enough so that nanometer-sized structures can be resolved despite the tens of micrometers lateral resolution of the PES.…”
Section: Introductionmentioning
confidence: 99%
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