volume 30, issue 43, Pno-no 2010
DOI: 10.1002/chin.199943290
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Jennifer L. Mass,
James M. Burlitch,
Duane B. Barber
et al.

Abstract: Crystallization and Spectroscopic Properties of Electron-Beam-Deposited, Chromium-Doped, Forsterite Films.-A sol-gel prepared, Cr-doped, Mg and Si containing oxide mixture is used as a target material for the electron-beam deposition of 1.2 µm thick Cr-doped forsterite films (MgSiO 4 :Cr) onto single crystal quartz substrates. The as-deposited films are amorphous and have nearly full density. Heating the films to 650 • C produces isolated forsterite crystallites of 50-250 nm size in an amorphous matrix. These…

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