2009
DOI: 10.1088/1674-4926/30/8/082002
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Charge transport performance of high resistivity CdZnTe crystals doped with In/Al

Abstract: To evaluate the charge transport properties of as-grown high resistivity CdZnTe crystals doped with In/Al, the α particle spectroscopic response was measured using an un-collimated 241Am (5.48 MeV) radioactive source at room temperature. The electron mobility lifetime products (μτ)e of the CdZnTe crystals were predicted by fitting plots of photo-peak position versus electrical field strength using the single carrier Hecht equation. A TOF technique was employed to evaluate the electron mobility for CdZnTe cryst… Show more

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Cited by 4 publications
(3 citation statements)
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“…The mean depth of the incident α-particles in FPB was calculated using SRIM to be 29.1 μm (Figure S6), which was much smaller than the FPB sample thickness. Therefore, only a single polarity of carriers participated in the transport process, depending on the bias polarity of the irradiated electrode. …”
Section: Resultsmentioning
confidence: 99%
“…The mean depth of the incident α-particles in FPB was calculated using SRIM to be 29.1 μm (Figure S6), which was much smaller than the FPB sample thickness. Therefore, only a single polarity of carriers participated in the transport process, depending on the bias polarity of the irradiated electrode. …”
Section: Resultsmentioning
confidence: 99%
“…A 5.49 MeV 241 Am α particle source was employed to evaluate the radiation detection performance of FPB-SSM SCs. Because the mean penetrating depth of 5.49 MeV α particles in FPB is ∼29.2 μm (≪1 mm, seen in Figure S10), only hole carriers participated in the transport process when the α particles are incident from the anode electrode. ,, Figure S11 shows the α particle pulse height spectra of the AZO/FPB-4/Au detector as a function of biases with resolved full-energy peaks. The full-energy peaks are observed clearly with an energy resolution of 21.4% at a bias voltage of 60 V at room temperature (Figure b).…”
Section: Resultsmentioning
confidence: 99%
“…The resistivity temperature dependence of the CZT:In crystal is described by an exponential dependence with the activation energy, ∆E. Analyzing the dark dependence of the CZT:In resistivity on temperature, one can obtain important information about the temperature dependence of the Fermi-level position in the band-gap, as well as about the nature of the impurity, which determines the electrical conductivity [20]. To estimate the energy-level compensation degree that defines the dark conductivity, suppose that the Fermi-level position and the conductivity of the material are determined by a donor with energy, E d , and concentration of N d , and the concentration of compensating acceptors is denoted as N а .…”
Section: Results and Their Discussionmentioning
confidence: 99%