Charge flow during metal-insulator contact

Schönenberger, C.

doi:10.1103/physrevb.45.3861

Cited by 69 publications

(45 citation statements)

References 11 publications

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“…A MultiMode Scanning Probe Microscope (SPM) with Extender Electronics Module was used to map surface topography and charge distribution of charged surfaces (Mazumder et al, 1995;Yangida et al, 1993;Stern et al, 1988;Terris et al, 1989;Schonenberger, 1992;Schonenberger & Alvarado, 1990). Electrostatic Force Microscopy (EFM) in Lift-Mode allows the imaging of surface topography and charge distribution simultaneously.…”

Section: Electrostatic Force Microscopy (Efm)mentioning

confidence: 99%

Measurement of Surface Topography, Packing Density, and Surface Charge Distribution of an Electrostatically Deposited Powder Layer by Image Analysis of Fluorescent Latex Spheres

Mazumder¹,

Biris²,

Sharma³

et al. 2001

Particulate Science and Technology

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A novel method of nonintrusive measurement of surface pro®le, packing density, and surface charge distributions of a powder layer deposited on a substrate is reported. The method employs the deposition of electrostatically charged monodispersed uorescent latex spheres (FLS), approximately 2 mm in diameter, on the surface of: (1) the substrate before deposition, (2) the powder layer after deposition, and (3) the ®lm formed by curing the powder layer. The surface topography in all cases was mapped using an epi-¯uorescent microscope with a vertical resolution of § 2 mm in the z axis and § 10 mm in the x and y axes. An area of 1 cm £ 1 cm is scanned in 1 mm segments, providing approximately 100 data points per cm 2 for the surface topography. For each measurement of surface topography, the substrate was positioned on the microscope stage in a manner such that the reference points (x, y, and z) remained the same for all measurements of the substrate. The surface pro®les, with respect to the same reference points, were plotted using Origin 6.0 software for 3D presentation of the topography. The method was also applied to map the surface charge density distribution of electrostatically charged surfaces. The FLS imaging method provides a new tool for examination of surface pro®les, packing density, and charge distribution of powder layers on a microscopic scale not provided by optical or atomic force=electrostatic force microscopy (AFM=EFM). While AFM and EFM are very effective in providing similar information with nanometer resolution, they cannot be directly applied on a larger macroscopic scale to study powder layers and for a larger surface area (up to 1 cm 2 or greater) involving deposited particles in the range of 1±50 mm in diameter. For AFM, the range in the z-axis is limited to § 3 mm and the x-y scan area is limited to 100 mm £ 100 mm. The FLS method has a much wider range but it is operated manually; an automated scanning process is required for rapid measurement. A comparison of the FLS and EFM techniques as they apply to analyzing charge distribution on coal surfaces is presented.

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Section: Electrostatic Force Microscopy (Efm)mentioning

confidence: 99%

Measurement of Surface Topography, Packing Density, and Surface Charge Distribution of an Electrostatically Deposited Powder Layer by Image Analysis of Fluorescent Latex Spheres

Mazumder¹,

Biris²,

Sharma³

et al. 2001

Particulate Science and Technology

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“…The possibility to quantify stored charge density by EFM has been well documented [7][8][9]. However, recent studies provide a nuanced view of the EFM procedure, namely arguing its sensitivity to applied bias during the measurements and its accuracy limitation caused by image charge effects [10,11].…”

Section: Introductionmentioning

confidence: 99%

Space charge probing in dielectrics at nanometer scale by techniques derived from atomic force microscopy

Villeneuve

Teyssèdre

Mortreuil

et al. 2013

2013 IEEE International Conference on Solid Dielectrics (ICSD)

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Charges accumulation and injection in dielectric material remains critical because it is related to a lot of applications or issues. A deep understanding of interfaces phenomena is needed, but classical space charges techniques exhibit less resolution than the required one. Atomic Force Microscopy (AFM) because of its sensitivity to electrostatic force and its high resolution (close to nanometer) appears to be the best method to characterize charges at nanoscale. Here, two techniques are investigated and compare: Kelvin Force Microscopy (KFM) and Electrostatic Force Distance Curve (EFDC). KFM is used to measured surface potential modification induced by charges. However vertical localization of charges seems difficult to attempt. EFDC follows electrostatic force as function of tip-surface distance. This technique appears promising because of its high resolution, sensitivity to charges localization and distance dependance.

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“…Electrostatic force microscopy, which allows the study of light-induced charge distributions at the surface of photorefractive materials, is ideal for this purpose. A sensitive method for charge detection on insulating surfaces was introduced by Terris et al [3], and it was later applied by Schönenberger to image single electrons [4].…”

mentioning

confidence: 99%

Charge distribution on photorefractive crystals observed with an atomic force microscope

Soergel

Krieger

Vlad

1998

Applied Physics A: Materials Science & Processing

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Electrostatic force detection with an atomic force microscope (AFM) is applied to the study of light-induced charge gratings on photorefractive materials. These gratings are generated by two crossed laser beams at a wavelength of 514 nm in Bi 12 SiO 20 and BaTiO 3 crystals. In contrast to conventional optical investigations of photorefractivity, where volume gratings of the refractive index are indirectly observed, the AFM allows a direct study of the charge gratings at the surface. Charge images of the two crystal materials are compared. The saturation of the charge gratings at increasing laser fluence is measured for both materials. From the observation of the phase shift between the light-intensity grating and the charge grating, the polarity of the charge carriers in Bi 12 SiO 20 is determined.The atomic force microscope (AFM) is by the far the most versatile instrument of the growing family of scanning probe microscopes. This is due to the multitude of different forces that can be studied with this instrument. In this paper, we present an application of the AFM to the measurement of electrostatic forces for the detection of light-induced charge distributions on photorefractive crystals.Photorefractive materials are of growing interest because of their applications in such fields as high-density optical data storage, real-time holography and optical phase conjugation, to name but a few. The photorefractive effect occurs in crystals that are both photoconducting and electro-optic [1]. In these materials, a spatially modulated light-intensity distribution, e.g. a light grating generated by the interference of two laser beams, is used to excite charge carriers. These carriers are redistributed by drift and diffusion until they are trapped to form a space-charge distribution. The accompanying electrostatic fields lead to a refractive-index pattern via the electro-optic effect. In the case of a grating, it is easily seen how this can be "read" by Bragg diffraction.In such an experiment, as in most of the conventional methods for investigating photorefractivity, the properties of the bulk of the material are studied. Increasingly, however, photorefractive materials are used as thin films, waveguides and optical fibers [2], and in these instances surface effects begin to be important. A surface-specific study of photorefractivity therefore becomes desirable. Electrostatic force microscopy, which allows the study of light-induced charge distributions at the surface of photorefractive materials, is ideal for this purpose. A sensitive method for charge detection on insulating surfaces was introduced by Terris et al. [3], and it was later applied by Schönenberger to image single electrons [4].A first demonstration of light-induced charge gratings on BaTiO 3 crystals was recently reported [5]. Here we present a detailed study of such gratings on Bi 12 SiO 20 (BSO) and on BaTiO 3 . A surface-specific microstructure in the charge images is revealed, and a saturation of the gratings at increasing light fluence was observed....

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Charge flow during metal-insulator contact

Cited by 69 publications

References 11 publications

Measurement of Surface Topography, Packing Density, and Surface Charge Distribution of an Electrostatically Deposited Powder Layer by Image Analysis of Fluorescent Latex Spheres

Measurement of Surface Topography, Packing Density, and Surface Charge Distribution of an Electrostatically Deposited Powder Layer by Image Analysis of Fluorescent Latex Spheres

Space charge probing in dielectrics at nanometer scale by techniques derived from atomic force microscopy

Charge distribution on photorefractive crystals observed with an atomic force microscope

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