2011
DOI: 10.1109/ted.2011.2160066
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Characterization of the Variable Retention Time in Dynamic Random Access Memory

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Cited by 22 publications
(13 citation statements)
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“…Previous work has shown that each VRT cell spends an exponentially distributed amount of time in each state [14,31], and that the distribution of time constants for these exponential distributions is itself exponentially distributed [15]. The shape of our observed distributions appear to be consistent with this prior work.…”
Section: Time Between State Changessupporting
confidence: 87%
See 1 more Smart Citation
“…Previous work has shown that each VRT cell spends an exponentially distributed amount of time in each state [14,31], and that the distribution of time constants for these exponential distributions is itself exponentially distributed [15]. The shape of our observed distributions appear to be consistent with this prior work.…”
Section: Time Between State Changessupporting
confidence: 87%
“…These works established the key properties of VRT: the existence of multiple retention time states in VRT cells and the exponentially-distributed nature of the amount of time spent in each state. Since then, interest in VRT has focused on identifying its physical cause, primarily by measuring circuit-level features such as leakage currents [3,14,15,16,25,27,29]. No recent work we are aware of has evaluated the impact of VRT in modern DRAM devices.…”
Section: Variable Retention Timementioning
confidence: 99%
“…While DRAM cells have varying retention time [4], the JEDEC standards specify a minimum of 64ms retention time (32ms for high temperature), which means all DRAM rows must be refreshed within this small time period. Let's call this time period as DRAM Retention Time.…”
Section: Dram Refresh: Background and Terminologymentioning
confidence: 99%
“…Such schemes can either decommission high refresh pages [Venkatesan et al 2006] or use multirate refresh where high-retention pages (rows) are refreshed infrequently [Kim and Papaefthymiou 2001;Liu et al 2012;Venkatesan et al 2006]. These approaches rely on having retention characteristics of DRAM cells available and that these characteristics do not change.…”
Section: Other Related Workmentioning
confidence: 99%
“…DRAM cells maintain data integrity using refresh operations, a process whereby the data is rewritten to the cell periodically using sense amplifiers. Although DRAM cells have varying retention time [Kim et al 2011], the JEDEC standards specify a minimum of 64ms retention time (32ms for high temperature), which means that all DRAM rows must be refreshed within this small time period. Let's call this time period DRAM Retention Time.…”
Section: Introductionmentioning
confidence: 99%