Characterization of DECam focal plane detectors

Diehl, H. T.; Angstadt, R.; Campa, J.; Cease, H.; Derylo, G.; Emes, J.; Estrada, J.; Kubik, D.; Flaugher, B.; Holland, S.; Jonas, M.; Kolbe, W.; Krider, J.; Kuhlmann, S.; Kuk, K.; Maiorino, M.; Palaio, N.P.; Plazas, A. A.; Roe, Natalie A.; Scarpine, V.; Schultz, K.R.; Shaw, Terri; Spinka, H. M.; Stuermer, W.

doi:10.1117/12.790053

Cited by 23 publications

(32 citation statements)

References 12 publications

(9 reference statements)

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“…The readout system utilized in these experiments was originally developed for the DECAM project (Dark Energy Camera, [11]) at Fermilab [15,16], that was modified to handle the skipper technology. The CCD, placed in an aluminium dewar and run at 143 • K to diminish dark current generation, was tested at one of the Fermilab's laboratories.…”

Section: Resultsmentioning

confidence: 99%

“…The vertical and horizontal charge transfer inefficiency measured for several detectors fabricated on high resistivity silicon was found to be less than 1 × 10 −6 [15]. The pixel in the last row and column in the array is the one that experiment the major charge loss; other pixels in the array are less affected because less transfers are needed to displace its charge to the output stage.…”

Section: Fig 15mentioning

confidence: 94%

“…These measurements are particularly difficult because it is difficult to discriminate Fig. 16 Dark current measurements for a CCD fabricated on high resistivity silicon [15] the leakage current generation from environmental radiation at those low background levels.…”

Section: Fig 15mentioning

confidence: 99%

“…DC noise is time dependent and can affect the performance of the detector for large readout times, or in the case of Skipper CCD when a high number of samples N are averaged to obtain very low RN. Figure 16 shows the dark current generation (average number of generated charge per pixel per hour) as a function of the temperature, measured for a CCD fabricated on high resistivity silicon at Fermilab's labs [15]. For similar CCDs running at 100 K for the DAMIC experiment [20], a DC of 2 electrons per pixel per day was measured.…”

Section: Fig 15mentioning

confidence: 99%

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Sub-electron readout noise in a Skipper CCD fabricated on high resistivity silicon

et al. 2012

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The readout noise for Charge-Coupled Devices (CCDs) has been the main limitation when using these detectors for measuring small amplitude signals. A scientific CCD fabricated on a high-resistivity silicon substrate utilizing a floating gate amplifier with the capability of multiple sampling of the charge signal is described in this paper. The Skipper CCD architecture and its Exp Astron (2012) 34:43-64 advantages for low noise applications are discussed. A technique for obtaining sub-electron readout noise levels is presented, and its noise and signal characteristics are derived. We demonstrate that with this procedure a very low readout noise of 0.2e − RMS can be achieved. The contribution of other noise sources (output stage, vertical and horizontal charge transfer inefficiency, and dark current noise) are also considered. The optimum number of samples for achieving the total lowest possible noise level is obtained. This technique is applied to an X-rays experiment using a 55 Fe source.

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Section: Resultsmentioning

confidence: 99%

Section: Fig 15mentioning

confidence: 94%

Section: Fig 15mentioning

confidence: 99%

Section: Fig 15mentioning

confidence: 99%

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Sub-electron readout noise in a Skipper CCD fabricated on high resistivity silicon

et al. 2012

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“…The measurements were made with the CCD working at approximately 135 K to avoid any spurious generation of charge. At this temperature the dark current contribution is less than a 1e-/pixel/hour and has a negligible effect on the alpha detection [38]. Figure 2 shows an image obtained by exposing the CCD active surface to different ionizing radiations.…”

Section: Introductionmentioning

confidence: 99%

Development of a novel neutron detection technique by using a boron layer coating a Charge Coupled Device

Blostein¹,

Estrada²,

Tartaglione³

et al. 2015

J. Inst.

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This article describes the design features and the first test measurements obtained during the installation of a novel high resolution 2D neutron detection technique. The technique proposed in this work consists of a boron layer (enriched in 10 B) placed on a scientific Charge Coupled Device (CCD). After the nuclear reaction 10 B(n,) 7 Li, the CCD detects the emitted charge particles thus obtaining information on the neutron absorption position. The abovementioned ionizing particles, with energies in the range 0.5-5.5 MeV, produce a plasma effect in the CCD which is recorded as a circular spot. This characteristic circular shape, as well as the relationship observed between the spot diameter and the charge collected, is used for the event recognition, allowing the discrimination of undesirable gamma events. We present the first results recently obtained with this technique, which has the potential to perform neutron tomography investigations with a spatial resolution better than that previously achieved. Numerical simulations indicate that the spatial resolution of this technique will be about 15 m, and the intrinsic detection efficiency for thermal neutrons will be about 3 %. We compare the proposed technique with other neutron detection techniques and analyze its advantages and disadvantages.

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Achieving sub electron noise in CCD systems by means of digital filtering techniques that lower 1/f pixel correlated noise

et al. 2012

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Scientific CCDs designed in thick high resistivity silicon (Si) are excellent detectors for astronomy, high energy and nuclear physics, and instrumentation. Many applications can benefit from CCDs ultra low noise readout systems. The present work shows how sub electron noise CCD images can be achieved using digital signal processing techniques. These techniques allow 0.4 electrons of noise at readout bandwidths of up to 10 Kpixels per second while keeping the full CCD spatial resolution and signal dynamic range.

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Characterization of DECam focal plane detectors

Cited by 23 publications

References 12 publications

Sub-electron readout noise in a Skipper CCD fabricated on high resistivity silicon

Sub-electron readout noise in a Skipper CCD fabricated on high resistivity silicon

Development of a novel neutron detection technique by using a boron layer coating a Charge Coupled Device

Achieving sub electron noise in CCD systems by means of digital filtering techniques that lower 1/f pixel correlated noise

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