2023
DOI: 10.1016/j.sna.2023.114470
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Channel length effect of P3HT:ZnO hybrid blend layer on electrical characteristics of thin-film transistors

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Cited by 4 publications
(2 citation statements)
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“…It was seen that the energy gap reduce from 2.1 eV (pure P3HT) to 1.75 eV (P3HT:AuNPs (0.1%)) and this device exhibited responsivity of 35.65 μA W −1 . However, the performance of several organic devices based on P3HT thin films were enhanced due to improving the optical, electrical, and photoelectrical properties of P3HT active layer by using doping method such as, P3H:WO3 hybrid thin film transistors [24], nitrogen dioxide sensor based on P3HT:OH-MWCNTs thin film transistor [25], P3HT:ZnO hybrid thin film transistors [26], organic field effect transistor (OFET) based on P3HT/MoS2 thin-film for Ammonia sensing applications [27], photodetectors based on P3HT-rGO composites [28], and organic Schottky diode bas on P3HT thin films [29].…”
Section: Introductionmentioning
confidence: 99%
“…It was seen that the energy gap reduce from 2.1 eV (pure P3HT) to 1.75 eV (P3HT:AuNPs (0.1%)) and this device exhibited responsivity of 35.65 μA W −1 . However, the performance of several organic devices based on P3HT thin films were enhanced due to improving the optical, electrical, and photoelectrical properties of P3HT active layer by using doping method such as, P3H:WO3 hybrid thin film transistors [24], nitrogen dioxide sensor based on P3HT:OH-MWCNTs thin film transistor [25], P3HT:ZnO hybrid thin film transistors [26], organic field effect transistor (OFET) based on P3HT/MoS2 thin-film for Ammonia sensing applications [27], photodetectors based on P3HT-rGO composites [28], and organic Schottky diode bas on P3HT thin films [29].…”
Section: Introductionmentioning
confidence: 99%
“…A SiO x N y gate insulator was employed to fabricate ZnO TFTs with a low gate leakage current [9], and (Ba,Sr)TiO 3 gate oxide was employed in ZnO-based TFT for low-voltage operation [10]. Moreover, ZnO-based TFTs were fabricated using a conventional SiO 2 gate oxide [11,12]. Top gate ZnO−Al 2 O 3 thin film transistors fabricated using a chemical bath deposition technique was reported [13].…”
Section: Introductionmentioning
confidence: 99%