Superlattices and Microstructures volume 45, issue 4-5, P407-412 2009 DOI: 10.1016/j.spmi.2008.11.006 View full text
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C. Díaz-Guerra, A. Mitric, J. Piqueras, T. Duffar

Abstract: a b s t r a c tCathodoluminescence (CL) in the scanning electron microscope and wavelength dispersive X-ray microanalysis (WDX) have been used to assess the homogeneity of a whole Te-doped In x Ga 1−x Sb ingot grown by the vertical Bridgman method under an alternating magnetic field. In particular, WDX has been used to determine the chemical composition of the ingot along the growth axis and several radial directions, while CL has been used to investigate the effective incorporation of In into the alloy, the …

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