Calculation of van der Waals interactions involving lipid vesicles

Mitev, D.; Grigorov, L.; Vassilieff, C.S.

doi:10.1016/s0927-7765(99)00032-6

Cited by 4 publications

(5 citation statements)

References 20 publications

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“…Vesicles and bilayers have colloidal size dimensions, so interactions between them may be treated according to Derjaguin-Landau-Verwey-Overbeek (DLVO) theory, which involves van der Waals and electrostatic contributions [24,25]. Inclusion of hydration and steric contributions (i.e., extended-DLVO) has previously led to accurate predictions and verifications of experimental observations [26][27][28][29].…”

Section: Introductionmentioning

confidence: 99%

Interaction energies between oxide surfaces and multiple phosphatidylcholine bilayers from extended-DLVO theory

Oleson

Sahai

2010

Journal of Colloid and Interface Science

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Section: Introductionmentioning

confidence: 99%

Interaction energies between oxide surfaces and multiple phosphatidylcholine bilayers from extended-DLVO theory

Oleson

Sahai

2010

Journal of Colloid and Interface Science

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“…Inspired by the recent calculation of van der Waals interactions involving lipid vesicles [13] we consider once again the symmetrical model (3.4) but with modified leftmost and rightmost half-spaces. For z > L/2 we write…”

Section: Van Der Waals Interactions Involving Lipid and Water Layersmentioning

confidence: 99%

“…This system when a = 0 has been studied in [13]. The dielectric permittivity of water and lipid DPPC (dipalmitoylphosphatidylcholine) are described in semiempirical approximation with formulae of the type [16]…”

Section: Appendix a The Contribution Of Te Modes To The Force Formula...mentioning

confidence: 99%

“…is the macroscopic analogue of the compound Hamaker constant obtained from pair-wise summation of additive dispersion molecular interactions [13,16]. The cubic terms which appear in the second integral in (B.8) correspond to a non-additivity correction due to the nonhomogeneity of the system (a = 0).…”

Section: Appendix a The Contribution Of Te Modes To The Force Formula...mentioning

confidence: 99%

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van der Waals interactions between bodies having inhomogeneous dielectric permittivities

Genchev¹

2006

J. Phys.: Condens. Matter

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We present analytical results for the contribution of electromagnetic fluctuations in the distribution of interaction energy and pressure in isotropic systems whose properties depend only on one spatial coordinate. If we neglect the continuous inhomogeneity introduced here and consider the simplest case of two macroscopic homogeneous bodies separated by a homogeneous film our result reduces to the well-known Lifshitz formula. As a first application of theory, a one-dimensional modulated system with a homogeneous layer embedded in it is considered and a suitable perturbation theory for this system is developed. In the main part of this paper we limit the calculations to the non-retarded case, that is only the calculation of van der Waals interaction energy is given. As a second application of theory we consider the van der Waals interaction between two semi-infinite media across a planar region within which there is a thin film having an arbitrary variation of the dielectric permittivity. The importance of the precise evaluation of the transverse magnetic surface mode dispersion relation in inhomogeneous media is elucidated. For concreteness the influence of the transition layer between water and lipid in a symmetrical configuration is considered in some detail. The zero-frequency term and the dispersion-only contribution to the Hamaker coefficient are given analytically using some approximations and modelling of the dielectric constants reasonable for these dielectrics at room temperature. As a whole the results indicate the necessity of performing Lifshitz-type calculations on realistic inhomogeneous layered models, as are the models described here, for accurate interaction energy modelling. Of course further work is needed for real justification of the continuous variation of dielectric permittivities across phase interfaces.

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“…Many researches have been investigated the particle adhesion on the surface. [5][6][7][8][9][10][11][12][13][14][15][16] Lee et al have shown that the calculation of the interaction force between a particle and a surface and the adhesion force measurement by atomic force microscopy (AFM) can be used to understand the adhesion and removal of particles on surface in post CMP cleaning process. 17) In this paper, the adhesion and removal of silica and alumina particles on surfaces has been investigated during wet processes at different pH values.…”

Section: Introductionmentioning

confidence: 99%

Particle Adhesion and Removal on EUV Mask Layers During Wet Cleaning

Lee¹,

Park²,

Busnaina

2005

Jpn. J. Appl. Phys.

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Extreme ultraviolet (EUV) masks have a very stringent cleanliness requirement that present new challenges to nanolithography industry. The cleaning of EUV mask surface is required at every exposure level due to the absence of a pellicle layer. In this study, the adhesion and removal of particles on EUV masks is investigated by calculating the interaction force and measuring the adhesion force using atomic force microscopy (AFM). Zeta potential measurements showed that the calculated interaction force was attractive on Si capping layer and Cr absorbed layer for both silica and alumina particle at all pH ranges investigated. However, the measured adhesion force of Si capping layer was similar to that of bare Si at neutral and alkaline pHs. The calculated interaction force of SiO2 buffer layer was most repulsive and the lowest adhesion force was measured. This indicates that the SiO2 buffer layer has a better cleaning efficiency at neutral and alkaline pH. The calculation of interaction force between particle and surface and measurement of adhesion force shows that a lower particle removal efficiency was expected on Cr absorber layer surface.

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Calculation of van der Waals interactions involving lipid vesicles

Cited by 4 publications

References 20 publications

Interaction energies between oxide surfaces and multiple phosphatidylcholine bilayers from extended-DLVO theory

Interaction energies between oxide surfaces and multiple phosphatidylcholine bilayers from extended-DLVO theory

van der Waals interactions between bodies having inhomogeneous dielectric permittivities

Particle Adhesion and Removal on EUV Mask Layers During Wet Cleaning

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