Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, Franz J.; Bielefeldt, H.; Hembacher, Stefan; Mannhart, J.

doi:10.1016/s0169-4332(98)00553-4

Cited by 185 publications

(153 citation statements)

References 17 publications

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“…The link between the tip-surface interaction and an NC-SFM simulated image is a model of the oscillations of the cantilever under the influence of the tip-surface interaction. Detailed analyses of the tip oscillations and ways to model them are given by Giessibl (1995Giessibl ( , 1997; Aimé et al (1999); Giessibl et al (1999); Sasaki and Tsukada (1999); Dü rig (2000); Schwarz, Hö lscher, and Wiesendanger (2000); García and Pé rez (2002); Morita et al (2002). However, a simple model can be derived under some basic assumptions.…”

Section: E Modeling Oscillationsmentioning

confidence: 99%

Theories of scanning probe microscopes at the atomic scale

2003

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Significant progress has been made both in experimentation and in theoretical modeling of scanning probe microscopy. The theoretical models used to analyze and interpret experimental scanning probe microscope (SPM) images and spectroscopic data now provide information not only about the surface, but also the probe tip and physical changes occurring during the scanning process. The aim of this review is to discuss and compare the present status of computational modeling of two of the most popular SPM methods-scanning tunneling microscopy and scanning force microscopy-in conjunction with their applications to studies of surface structure and properties with atomic resolution. In the context of these atomic-scale applications, for the scanning force microscope (SFM), this review focuses primarily on recent noncontact SFM (NC-SFM) results. After a brief introduction to the experimental techniques and the main factors determining image formation, the authors consider the theoretical models developed for the scanning tunneling microscope (STM) and the SFM. Both techniques are treated from the same general perspective of a sharp tip interacting with the surface-the only difference being that the control parameter in the STM is the tunneling current and in the SFM it is the force. The existing methods for calculating STM and SFM images are described and illustrated using numerous examples, primarily from the authors' own simulations, but also from the literature. Theoretical and practical aspects of the techniques applied in STM and SFM modeling are compared. Finally, the authors discuss modeling as it relates to SPM applications in studying surface properties, such as adsorption, point defects, spin manipulation, and phonon excitation. CONTENTS

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Section: E Modeling Oscillationsmentioning

confidence: 99%

Theories of scanning probe microscopes at the atomic scale

2003

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“…These long-range attractive forces are greatly reduced in liquid, making it possible to oscillate the cantilever with small amplitude. The small-amplitude operation is proven to be Frequency [Hz] (c) (b) effective for enhancing the sensitivity to the short-range interaction force, 23 thereby obtaining high spatial resolution. 24 For a reasonable immunity to the electronic circuit noise, the amplitude of the deflection signal should be larger than 100 mV, while the amplitude should be kept lower than a few volts to avoid the harmonic distortions caused by the insufficient slew rate of the OPAMP at high frequencies.…”

Section: B Differential Amplifiermentioning

confidence: 99%

Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy

Fukuma

2009

Review of Scientific Instruments

124

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I developed a wideband low-noise optical beam deflection sensor with a photothermal cantilever excitation system for liquid-environment atomic force microscopy. The developed sensor has a 10 MHz bandwidth and 4.7 fm/ ͱ Hz deflection noise density in water. The theoretically limited noise performance ͑i.e., the noise level limited only by the photodiode shot noise͒ has been achieved in liquid for the first time. Owing to the wide bandwidth and the replaceable focus lens design, the sensor is applicable to cantilevers with various dimensions. The deflection noise densities of less than 7.8 fm/ ͱ Hz have been achieved in water for cantilevers with lengths from 35 to 125 m. The ideal amplitude and phase versus frequency curves without distortion are obtained with the developed photothermal excitation system. The excitation system is applicable to relatively stiff cantilevers ͑Ͼ20 N / m͒ in liquid, making it possible to obtain true atomic-resolution images in liquid. True atomic-resolution imaging of mica in water is demonstrated using the developed deflection sensor and the photothermal excitation system.

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“…The initial values for k and A have been found empirically and a theoretical study has shown that maximum signal-to-noise ratio should be obtained with AϷ0.3-1 nm. 6 For achieving stable oscillation with such small amplitudes, the spring constant k of the CL must be of the order of a few hundred newtons per meter. These findings have motivated the attempt to achieve atomic resolution with quartz tuning forks with a stiffness of a few kilonewtons per meter.…”

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confidence: 99%